حضرت أفلام رقيقة من TiO2 بطريقة SOL-GELعلى ركائز من الزجاج العادي باستخدام المحاليل الأولية من ثلاثي كلوريد التيتانيوم والأيتانول وهيدروكسيد الصوديوم وحمض كلور الماء والماء المقطر. لدنت الأفلام المحضرة حراريا عند درجات حرارة (500-400-300-200)لمدة ساعة واحدة.درست البنية البلورية للأفلام المحضرة والمعالجة حراريا بتقانة XRD .بينت الدراسة أن الأفلام المحضرة تتبلور وفق البنية البلورية (orthorhombic) . تم حساب ثوابت الشبكة البلورية ووجد أها تتوافق بشكل جيد مع بيانات بنك المعلومات JPCDS ومع بعض الأعمال العلمية.
The thin films of TiO2 were prepared by the Sol-Gel, on glass
subtracts by using the following initial solutions: trichlorethylene
titanium, ethanol, sodium hydroxide and hydrochloric acid and
distilled water. The films were annealed at temperatures(200- 300-
400-500)c° for 1 hour. The structure of the prepared and annealed
films were studied by XRD. The XRD rusltes showed that the films
prepared crystallize according to orthorhombic Structure.Lattice
constants were calculated and it was found that it was consistent
with the data JPCDS and with some scientific works.
References used
CHEN, YI, ET AL; 2012 Grain size and thickness effect on the performance of sol-gel based TiO2 Schottky diodes Materials Chemistry and Physics, 123 591-595
Ulrike.D,2003,The surface science of titanium dioxide, USA, surface science Reports,vol.48,53-229
M.I.B.Bernardi, 2001,TiO2Thin Film Growth Using the MOCVD Method, Materials Research, Vol.4,No.3,223- 6,2001,Brasil
E.V.Buta, 2008,CHARACTERIZATION OF SPUTTERED TiO2 THIN FILMS,Faculty of Physics,Carol I Blvd., No.11,700506,IASI
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