يسمح مجهر القوة الذرية بالحصول على معلومات مجهرية عن بنية سطوح الأغشية و برسم صور لطبوغرافيتها تمثل تضاريس السطح، و مراقبة نمو الأغشية الرقيقة و تحديد برامترات الخشونة. قمنا في هذا العمل بدراسة برامترات الخشونة للسطح و معالمه.
AFM has been used to get microscopic information of the surface structure
and to plot topographies representing the surface relief. AFM technique can be
used to visualize the surface relief, specify the growth of thin films, and
determine Height parameters.
References used
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S. H. Deulkar, C. H. Bhosaile, M. Sharon, A study of structural, compositional and optical properties of spray-deposited non-stoichiometric (Zn,Fe)S thin films, J. Phys. Chem. Solids 65(2004)1879
We present in this paper a graphical study of regions of thermally deposited
ZnS thin films on glass by atomic force microscope (AFM). This study consists
of volume parameters and functional parameters of these films surfaces for the
object of inv
In this paper we present a study of ZnS thin films thermally deposited on
glass substrates, with different optical thicknesses. On topography micrographs
and feature parameters obtained by Atomic Force Microscope, we pursued the
islands formation
CdTe Thin films were deposited on silicon substrates by thermal
evaporation method. The geometric thickness was calculated using
interferometric method based on reflectance curve recorded with the
spectrophotometer. The Reflection of High-Energy E
In this paper we present the preparation of PbS nanocrystalline thin films
using Chemical Bath Deposition (CBD) technique. We have performed this
work in order to study the photoconductivity of PbS semi-conductor thin films.
The details of the pre
There has been much interest in photonic and spectroscopic devices that are
useful for controlling transmission and reflection coefficients such as multilayer
thin films, photonic crystals, and various Bragg structures in the form of
molds or multilayer thin films.