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Register a new userHeight and Feature Parameters Study of thermally evaporated ZnS thin films By AFM
دراسة برامترات الخشونة لأغشية ZnS الموضعة حرارياً على ركائز من الزجاج بمجهر القوة الذرية
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Damascus University ورقة بحثية
Publication date
2013
fields
Physics
and research's language is
العربية
Authors
سهام الطرابيشي( باحث )
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يسمح مجهر القوة الذرية بالحصول على معلومات مجهرية عن بنية سطوح الأغشية و برسم صور لطبوغرافيتها تمثل تضاريس السطح، و مراقبة نمو الأغشية الرقيقة و تحديد برامترات الخشونة. قمنا في هذا العمل بدراسة برامترات الخشونة للسطح و معالمه.
AFM has been used to get microscopic information of the surface structure and to plot topographies representing the surface relief. AFM technique can be used to visualize the surface relief, specify the growth of thin films, and determine Height parameters.
References used
Gao X. D., Li X. M, Yu W. D., Studies of zinc and lead chalcogenide thin films grown by SILAR Thin Solid films 468 (2004)43
Cheng J., Fan D., Wang H., Liu B. W., Chemical bath deposition of crystalline ZnS thin films, Semicond. Sci. Technol. 18 (2003)676
S. H. Deulkar, C. H. Bhosaile, M. Sharon, A study of structural, compositional and optical properties of spray-deposited non-stoichiometric (Zn,Fe)S thin films, J. Phys. Chem. Solids 65(2004)1879
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We present in this paper a graphical study of regions of thermally deposited
ZnS thin films on glass by atomic force microscope (AFM). This study consists
of volume parameters and functional parameters of these films surfaces for the
object of inv
estigating the possibility to retain fluids by these films. For doing
so, we registered Abbott-Firestone curves that are based on height distribution
for these films, we measured volume and functional parameters in the whole
pores. Using the thresholding operator we followed parameters distribution in
depth of the surface. At the end we compared these parameters by the results of
another study based on slice selection at different levels.
In this paper we present a study of ZnS thin films thermally deposited on
glass substrates, with different optical thicknesses. On topography micrographs
and feature parameters obtained by Atomic Force Microscope, we pursued the
islands formation
and growing in ZnS thin films even on the same optical
thickness of the film. For doing so, we analyzed the micrographs surface, using
Watershed Segmentation and Wolf pruning that allow the detection of
significant features on surfaces, Grain sorting operator and Parameter
Distribution Study.
CdTe Thin films were deposited on silicon substrates by thermal
evaporation method. The geometric thickness was calculated using
interferometric method based on reflectance curve recorded with the
spectrophotometer. The Reflection of High-Energy E
lectron Diffraction
(RHEED) patterns and XRD analysis reveals that the structure of the films are
polycrystalline with preferential orientation (111). The structure constant (a),
crystallite size (D), dislocation density (δ) and strain (ε) were calculated, and it
is observed that the crystallite size increases but micro-strain and dislocation
density decreases with increases in thin film thickness. The composition of the
samples was determined by Energy Dispersive X-ray Analysis (EDX) and it is
found that the wt.% of Cd increases and the wt.% of Te decreases with the
increases of film thickness due to the re-evaporation of Te.
In this paper we present the preparation of PbS nanocrystalline thin films
using Chemical Bath Deposition (CBD) technique. We have performed this
work in order to study the photoconductivity of PbS semi-conductor thin films.
The details of the pre
paration method are described. Thickness of deposited
films has been determined using mechanical and optical methods. From the
optical absorption measurements we have determined the band gap values.
Using the first approximation parabolic bands model and the obtained values
of band gaps, we have determined the size of PbS nanocrystallites. Also, we
have investigated the electrical and photoelectrical behaviors of the PbS films.
Our study shows that the size of PbS thin films nanocrystallites affects the
photoconductive properties of the material. Furthermore, investigations show
that there are two different sizes of grains located in two different layers, the
first one, with grain’s size of about 25nm, concerns the part of PbS deposited
directly on the glass substrate and the second layer, with grain’s size of about
70nm, concerns the PbS deposited on the first layer.
There has been much interest in photonic and spectroscopic devices that are
useful for controlling transmission and reflection coefficients such as multilayer
thin films, photonic crystals, and various Bragg structures in the form of
molds or multilayer thin films.
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