Study of Anisotropy and periodicity in certain magnetization distributions by Magnetic force microscopy

Magnetic force microscopy (MFM) is a variety of atomic force microscopy, where a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. In this work, we have used Dynamic (AC) noncontact AFM (NC-AFM) mode. A mode which provide micrographs for topography, oscillation amplitude changes and phase shift. Using the autocorrelation Operator, we studied the anisotropy and periodicity in magnetization distributions in different generations of floppy disks.

Study of Islands Formation and Growing in thin films by AFM

In this paper we present a study of ZnS thin films thermally deposited on glass substrates, with different optical thicknesses. On topography micrographs and feature parameters obtained by Atomic Force Microscope, we pursued the islands formation and growing in ZnS thin films even on the same optical thickness of the film. For doing so, we analyzed the micrographs surface, using Watershed Segmentation and Wolf pruning that allow the detection of significant features on surfaces, Grain sorting operator and Parameter Distribution Study.

The Study of Fluid retention parameters in porous thin films by AFM

We present in this paper a graphical study of regions of thermally deposited ZnS thin films on glass by atomic force microscope (AFM). This study consists of volume parameters and functional parameters of these films surfaces for the object of investigating the possibility to retain fluids by these films. For doing so, we registered Abbott-Firestone curves that are based on height distribution for these films, we measured volume and functional parameters in the whole pores. Using the thresholding operator we followed parameters distribution in depth of the surface. At the end we compared these parameters by the results of another study based on slice selection at different levels.

Height and Feature Parameters Study of thermally evaporated ZnS thin films By AFM

AFM has been used to get microscopic information of the surface structure and to plot topographies representing the surface relief. AFM technique can be used to visualize the surface relief, specify the growth of thin films, and determine Height parameters.