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Register a new userThe Retroreflection Index of Optical and Opto-electronical Systems
معامل الإرجاع الضوئي للأجهزة البصرية و البصرية- الالكترونية
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تحدث ظاهرة الضوء الراجع في كل الأدوات الضوئية و الأنظمة البصرية المستخدمة لكواشف ضوئية و مرايا و آلات تصوير و زجاج في محرق العدسات و أجهزة القياس الـضوئية مادامـت بعـض العناصـر الضوئية فيها مرجعة للضوء و لو بنسبة صغيرة جداً. ندرس في هذه الورقة المرجعات الضوئية و قياس معامل الإرجاع الضوئي بدقة للأجهـزة البـصرية و الأجهزة البصرية-الالكترونية المستخدمة في البحوث الضوئية الدقيقة، و سلوكها عند اسـتعمال حـزم ليزرية مختلفة (نيودميوم–ياغ المدروج الأول و الثاني، ليزر هليوم –نيون، ليزر ديود) و مـدى مطابقـة معامل الضوء الراجع للعلاقة النظرية الحاكمة لها. و قد تبين أن المرجع الضوئي الواحد يعيد الضوء بشكل مختلف بحـسب طـول الموجـة الليزريـة المستخدمة، و قد كانت حزمة الليزر بطول الموجة (532nm) هي الأكثر إرجاعاً، فـي حـين أن حزمـة الليزر بطول الموجة (1064nm) أقلها إرجاعاً. و هذا مفيد في التطبيقات التخصصية الدقيقة، و أمكن وصف العلاقات الرياضـية لمعـاملات الإرجـاع و علاقتها بطول موجة الليزر.
The retroreflection phenomenon takes place in all optical and optoelectronical devices and systems that use optical detectors, mirrors, CCD cameras, filters, or glasses in the focal point and in the optical measurement instruments, in general, provided that some of their optical components are retroreflective to light even for small apertures. The article studies a precise method to measure the retroreflection index of optical, opto-electronical systems, and treats the optical retroreflections which are used in applied research of light with various lasers such as: Nd:YAG first and second harmonics, He-Ne, and laser diodes. We have studies the conformity of our results to the theory of retroreflectors. We found that the retroreflection coefficient depends on laser wavelength. The article points out that at 532nm laser wavelength the retroreflection is greater than at 1064nm laser wavelength. The results of this paper can be used in applied research, and led to description of a mathematical relationship between the retroreflection index and laser wavelength.
References used
George, H. Seward, P. and Cort, S. (1999). Measurement and characterization of angular reflectance for cube-corners and microspheres, Paper 980171, OPT. ENG. (38), (1), P164-169
Madhusudana Rao, S. (2002). Method for measurement of the angles of a tetragonal for corner cube prism, Paper 010454; accepted for publication, OPT. ENG. (41),(7), P.1612-1614. Feb. 1, 2002
Madhusudana Rao, S. and Martor, J. (2007). Optimal design of retroreflection corner-cube sheets by geometric optics analysis, Paper; accepted for publication, OPT.ENG. VOL (46), (9), P.094002-1-14, Sep. 2007
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