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Quantum Metrology is one of the most promising application of quantum technologies. The aim of this research field is the estimation of unknown parameters exploiting quantum resources, whose application can lead to enhanced performances with respect to classical strategies. Several physical quantum systems can be employed to develop quantum sensors, and photonic systems represent ideal probes for a large number of metrological tasks. Here we review the basic concepts behind quantum metrology and then focus on the application of photonic technology for this task, with particular attention to phase estimation. We describe the current state of the art in the field in terms of platforms and quantum resources. Furthermore, we present the research area of multiparameter quantum metrology, where multiple parameters have to be estimated at the same time. We conclude by discussing the current experimental and theoretical challenges, and the open questions towards implementation of photonic quantum sensors with quantum-enhanced performances in the presence of noise.
Photonic states with large and fixed photon numbers, such as Fock states, enable quantum-enhanced metrology but remain an experimentally elusive resource. A potentially simple, deterministic and scalable way to generate these states consists of fully
Interferometric phase measurement is widely used to precisely determine quantities such as length, speed, and material properties. Without quantum correlations, the best phase sensitivity $Deltavarphi$ achievable using $n$ photons is the shot noise l
Quantum metrology research promises approaches to build new sensors that achieve the ultimate level of precision measurement and perform fundamentally better than modern sensors. Practical schemes that tolerate realistic fabrication imperfections and
Conventional strategies of quantum metrology are built upon POVMs, thereby possessing several general features, including the demolition of the state to be measured, the need of performing a number of measurements, and the degradation of performance
Quantum metrology fundamentally relies upon the efficient management of quantum uncertainties. We show that, under equilibrium conditions, the management of quantum noise becomes extremely flexible around the quantum critical point of a quantum many-