Atomically precise tailoring of graphene can enable unusual transport pathways and new nanometer-scale functional devices. Here we describe a recipe for the controlled production of highly regular 5-5-8 line defects in graphene by means of simultaneo
us electron irradiation and Joule heating by applied electric current. High-resolution transmission electron microscopy reveals individual steps of the growth process. Extending earlier theoretical work suggesting valley-discriminating capabilities of a graphene 5-5-8 line defect, we perform first-principles calculations of transport and find a strong energy dependence of valley polarization of the charge carriers across the defect. These findings inspire us to propose a compact electrostatically gated valley valve device, a critical component for valleytronics.
We report preliminary results of hypertriton observation in heavy-ion collisions at RHIC. We have identified 157 +- 30 candidates in the current sample containing ~10^8 Au+Au events at sqrt{s_{NN}} = 200 GeV. The production rate of hypertriton is clo
se to that of helium 3. No extra penalty factor is observed for hypertriton, in contrast to results observed at the AGS.
We review our recent work on the physical mechanisms limiting the mobility of graphene on SiO2. We have used intentional addition of charged scattering impurities and systematic variation of the dielectric environment to differentiate the effects of
charged impurities and short-range scatterers. The results show that charged impurities indeed lead to a conductivity linear in density in graphene, with a scattering magnitude that agrees quantitatively with theoretical estimates [1]; increased dielectric screening reduces scattering from charged impurities, but increases scattering from short-range scatterers [2]. We evaluate the effects of the corrugations (ripples) of graphene on SiO2 on transport by measuring the height-height correlation function. The results show that the corrugations cannot mimic long-range (charged impurity) scattering effects, and have too small an amplitude-to-wavelength ratio to significantly affect the observed mobility via short-range scattering [3, 4]. Temperature-dependent measurements show that longitudinal acoustic phonons in graphene produce a resistivity linear in temperature and independent of carrier density [5]; at higher temperatures, polar optical phonons of the SiO2 substrate give rise to an activated, carrier density-dependent resistivity [5]. Together the results paint a complete picture of charge carrier transport in graphene on SiO2 in the diffusive regime.
We reduce the dimensionless interaction strength in graphene by adding a water overlayer in ultra-high vacuum, thereby increasing dielectric screening. The mobility limited by long-range impurity scattering is increased over 30 percent, due to the ba
ckground dielectric constant enhancement leading to reduced interaction of electrons with charged impurities. However, the carrier-density-independent conductivity due to short range impurities is decreased by almost 40 percent, due to reduced screening of the impurity potential by conduction electrons. The minimum conductivity is nearly unchanged, due to canceling contributions from the electron/hole puddle density and long-range impurity mobility. Experimental data are compared with theoretical predictions with excellent agreement.
The linear dispersion relation in graphene[1,2] gives rise to a surprising prediction: the resistivity due to isotropic scatterers (e.g. white-noise disorder[3] or phonons[4-8]) is independent of carrier density n. Here we show that acoustic phonon s
cattering[4-6] is indeed independent of n, and places an intrinsic limit on the resistivity in graphene of only 30 Ohm at room temperature (RT). At a technologically-relevant carrier density of 10^12 cm^-2, the mean free path for electron-acoustic phonon scattering is >2 microns, and the intrinsic mobility limit is 2x10^5 cm^2/Vs, exceeding the highest known inorganic semiconductor (InSb, ~7.7x10^4 cm^2/Vs[9]) and semiconducting carbon nanotubes (~1x10^5 cm^2/Vs[10]). We also show that extrinsic scattering by surface phonons of the SiO2 substrate[11,12] adds a strong temperature dependent resistivity above ~200 K[8], limiting the RT mobility to ~4x10^4 cm^2/Vs, pointing out the importance of substrate choice for graphene devices[13].
Since the experimental realization of graphene1, extensive theoretical work has focused on short-range disorder2-5, ripples6, 7, or charged impurities2, 3, 8-13 to explain the conductivity as a function of carrier density sigma_(n)[1,14-18], and its
minimum value sigma_min near twice the conductance quantum 4e2/h[14, 15, 19, 20]. Here we vary the density of charged impurities nimp on clean graphene21 by deposition of potassium in ultra high vacuum. At non-zero carrier density, charged impurity scattering produces the ubiquitously observed1, 14-18 linear sigma_(n) with the theoretically-predicted magnitude. The predicted asymmetry11 for attractive vs. repulsive scattering of Dirac fermions is observed. Sigma_min occurs not at the carrier density which neutralizes nimp, but rather the carrier density at which the average impurity potential is zero10. Sigma_min decreases initially with nimp, reaching a minimum near 4e2/h at non-zero nimp, indicating that Sigma_min in present experimental samples does not probe Dirac-point physics14, 15, 19, 20 but rather carrier density inhomogeneity due to the impurity potential3, 9, 10.
