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Register a new userCation- and lattice-site-selective magnetic depth profiles of ultrathin $mathrm{Fe_3O_4}$(001) films
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Authors
Tobias Pohlmann
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A detailed understanding of ultrathin film surface properties is crucial for the proper interpretation of spectroscopic, catalytic and spin-transport data. We present x-ray magnetic circular dichroism (XMCD) and x-ray resonant magnetic reflectivity (XRMR) measurements on ultrathin $mathrm{Fe_3O_4}$ films to obtain magnetic depth profiles for the three resonant energies corresponding to the different cation species $mathrm{Fe^{2+}_{oct}}$, $mathrm{Fe^{3+}_{tet}}$ and $mathrm{Fe^{3+}_{oct}}$ located on octahedral and tetrahedral sites of the inverse spinel structure of $mathrm{Fe_3O_4}$. By analyzing the XMCD spectrum of $mathrm{Fe_3O_4}$ using multiplet calculations, the resonance energy of each cation species can be isolated. Performing XRMR on these three resonant energies yields magnetic depth profiles that correspond each to one specific cation species. The depth profiles of both kinds of $mathrm{Fe^{3+}}$ cations reveal a $mathrm{3.9 pm 1~r{A}}$-thick surface layer of enhanced magnetization, which is likely due to an excess of these ions at the expense of the $mathrm{Fe^{2+}_{oct}}$ species in the surface region. The magnetically enhanced $mathrm{Fe^{3+}_{tet}}$ layer is additionally shifted about $mathrm{3pm 1.5~r{A}}$ farther from the surface than the $mathrm{Fe^{3+}_{oct}}$ layer.
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