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Register a new userAn assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy
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X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available x-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called dose fractionation theorem of Hegerl and Hoppe to calculate the dose needed to make an image of a lifescience sample by XDM with a given resolution. We conclude that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered by reports in the literature. The tentative conclusion of this study is that XDM should be able to image frozen-hydrated protein samples at a resolution of about 10 nm with Rose-criterion image quality.
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Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.
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The X-ray free electron lasers (XFEL) can enable diffractive structural determination of protein crystals or single molecules that are too radiation-sensitive for conventional X-ray analysis. However the electronic form factor could have been modified during the ultrashort X-ray pulse due to photoionization and electron cascade caused by the intense X-ray pulse. For general X-ray imaging techniques, to minimize radiation damage effect is of major concern to ensure faithful reconstruction of the structure. Here we show that a radiation-damage-free diffraction can be achieved with an atomic spatial resolution, by using X-ray parametric down-conversion (XPDC), and two-color two-photon ghost diffraction. We illustrate that the formation of the diffraction patterns satisfies a condition analogous to the Bragg equation, with a resolution that could be as fine as the lattice length scale of several Angstrom. Because the samples are illuminated by the optical photons of low energy, they can be free of radiation damage.
Silicon Photomultipliers (SiPMs) are quickly replacing traditional photomultiplier tubes (PMTs) as the readout of choice for gamma-ray scintillation detectors in space. While they offer substantial size, weight and power saving, they have shown to be susceptible to radiation damage. SensL SiPMs with different cell sizes were irradiated with 64 MeV protons and 8 MeV electrons. In general, results show larger cell sizes are more susceptible to radiation damage with the largest 50 um SiPMs showing the greatest increase in current as a function of dose. Current increases were observed for doses as low at ~2 rad(Si) for protons and ~20 rad(Si) for electrons. The U.S. Naval Research Laboratorys (NRL) Strontium Iodide Radiation Instrument (SIRI-1) experienced a 528 uA increase in the bias current of the on-board 2x2 SensL J-series 60035 SiPM over its one-year mission in sun-synchronous orbit. The work here focuses on the increase in bulk current observed with increasing radiation damage and was performed to better quantify this effect as a function of dose for future mission. These include the future NRL mission SIRI-2, the follow on to SIRI-1, Glowbug and the GAGG Radiation Instrument (GARI).
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