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Register a new userMultidimensional optomechanical cantilevers for high frequency atomic force microscopy
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High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and therefore the frequency, of the cantilever - ultimately setting a limit to the time resolution of experiments. Here we demonstrate optomechanical detection of low-mass, high-frequency nanomechanical cantilevers (up to 20 MHz) that surpass these limits, anticipating their use for single-molecule force measurements. These cantilevers achieve 2 fm / sqrt(Hz) displacement noise floors, and force sensitivity down to 132 aN / sqrt(Hz). Furthermore, the ability to resolve both in-plane and out-of-plane motion of our cantilevers opens the door for ultrasensitive multidimensional force spectroscopy, and optomechanical interactions, such as tuning of the cantilever frequency in situ, provide new opportunities in high-speed, high-resolution experiments.
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While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electrostatic Discovery Atomic Force Microscopy, a machine learning based method which provides immediate quantitative maps of the electrostatic potential directly from Atomic Force Microscopy images with functionalized tips. We apply this to characterize the electrostatic properties of a variety of molecular systems and compare directly to reference simulations, demonstrating good agreement. This approach opens the door to reliable atomic scale electrostatic maps on any system with minimal computational overhead.
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale, thus elucidating interactions at play in fundamental processes. Here we leverage the combined benefits of micro/nanoelectromechanical systems and cavity optomechanics to fabricate a sensor for dynamic mode AFM at a frequency above 100 MHz. This is two decades above the fastest commercial AFM probes, suggesting opportunity for measuring forces at timescales unexplored so far. The fabrication is achieved using very-large scale integration technologies inherited from photonic silicon circuits. The probes ring optomechanical cavity is coupled to a 1.55 um laser light and features a 130 MHz mechanical resonance mode with a quality factor of 900 in air. A limit of detection in displacement of 3.10-16 m/sqrt(Hz) is obtained, enabling the detection of the Brownian motion of the probe and paving the way for force sensing experiments in the dynamic mode with a working vibration amplitude in the picometer range. Inserted in a custom AFM instrument embodiment, this optomechanical sensor demonstrates the capacity to perform force-distance measurements and to maintain a constant interaction strength between tip and sample, an essential requirement for AFM applications. Experiments show indeed a stable closed-loop operation with a setpoint of 4 nN/nm for an unprecedented sub-picometer vibration amplitude, where the tip-sample interaction is mediated by a stretched water meniscus.
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components in the microscope body are excited by a piezoelectric element that is intended for exciting the AFM cantilever oscillation and these spurious resonance modes cause the serious undesirable signal artifacts in both frequency shift and dissipation signals. We present an experimental setup to excite only the oscillation of the AFM cantilever in a fiber-optic interferometer system using optical excitation force. While the optical excitation force is provided by a separate laser light source with a different wavelength (excitation laser : {lambda} = 1310 nm), the excitation laser light is still guided through the same single-mode optical fiber that guides the laser light (detection laser : {lambda} = 1550 nm) used for the interferometric detection of the cantilever deflection. We present the details of the instrumentation and its performance. This setup allows us to eliminate the problems associated with the spurious mechanical resonances such as the apparent dissipation signal and the inaccuracy in the resonance frequency measurement.
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The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{i}dal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods. a) present adress: ISIS, Univ.
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