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Register a new userCalibrated force measurement in Atomic Force Microscopy using the Transient Fluctuation Theorem
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Added by
Caroline Crauste-Thibierge
Publication date
2020
fields
Physics
and research's language is
English
Authors
Samuel Albert
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No Arabic abstract
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{i}dal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods. a) present adress: ISIS, Univ.
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