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Register a new userOptical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
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Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components in the microscope body are excited by a piezoelectric element that is intended for exciting the AFM cantilever oscillation and these spurious resonance modes cause the serious undesirable signal artifacts in both frequency shift and dissipation signals. We present an experimental setup to excite only the oscillation of the AFM cantilever in a fiber-optic interferometer system using optical excitation force. While the optical excitation force is provided by a separate laser light source with a different wavelength (excitation laser : {lambda} = 1310 nm), the excitation laser light is still guided through the same single-mode optical fiber that guides the laser light (detection laser : {lambda} = 1550 nm) used for the interferometric detection of the cantilever deflection. We present the details of the instrumentation and its performance. This setup allows us to eliminate the problems associated with the spurious mechanical resonances such as the apparent dissipation signal and the inaccuracy in the resonance frequency measurement.
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In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes damages the cantilever or tip. To increase the throughput of AFM in industrial applications, the ability to automatically exchange and align the cantilever in a very short time with sufficient accuracy is required. In this paper, we present the development of an automated cantilever exchange and optical alignment instrument. We present an experimental proof of principle by exchanging various types of AFM cantilevers in 6 seconds with an accuracy better than 2 um. The exchange and alignment unit is miniaturized to allow for integration in a parallel AFM. The reliability of the demonstrator has also been evaluated. Ten thousand continuous exchange and alignment cycles were performed without failure. The automated exchange and alignment of the AFM cantilever overcome a large hurdle toward bringing AFM into high-volume manufacturing and industrial applications.
Piezoelectric nanowires are promising materials for sensing, actuation and energy harvesting, due to their enhanced properties at the nanoscale. However, quantitative characterization of piezoelectricity in nanomaterials is challenging due to practical limitations and the onset of additional electromechanical phenomena, such as the triboelectric and piezotronic effects. Here, we present an open-circuit conductive atomic force microscopy (cAFM) methodology for quantitative extraction of the axial piezoelectric coefficients of nanowires. We show, both theoretically and experimentally, that the standard short-circuit cAFM mode is inadequate for piezoelectric characterization of nanowires, and that such measurements are governed by competing mechanisms. We introduce an alternative open-circuit configuration, and employ time-resolved electromechanical measurements, to extract the piezoelectric coefficients. This method was applied to GaAs, an important semiconductor, with relatively low piezoelectric coefficients. The results obtained for GaAs,~0.4-1 pm/V, are in good agreement with existing knowledge and theory. Our method represents a significant advance in understanding the coexistence of different electromechanical effects, and in quantitative piezoelectric nanoscale characterization. The easy implementation will enable better understanding of electromechanics at the nanoscale.
While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electrostatic Discovery Atomic Force Microscopy, a machine learning based method which provides immediate quantitative maps of the electrostatic potential directly from Atomic Force Microscopy images with functionalized tips. We apply this to characterize the electrostatic properties of a variety of molecular systems and compare directly to reference simulations, demonstrating good agreement. This approach opens the door to reliable atomic scale electrostatic maps on any system with minimal computational overhead.
Strong confinement of charges in few electron systems such as in atoms, molecules and quantum dots leads to a spectrum of discrete energy levels that are often shared by several degenerate quantum states. Since the electronic structure is key to understanding their chemical properties, methods that probe these energy levels in situ are important. We show how electrostatic force detection using atomic force microscopy reveals the electronic structure of individual and coupled self-assembled quantum dots. An electron addition spectrum in the Coulomb blockade regime, resulting from a change in cantilever resonance frequency and dissipation during tunneling events, shows one by one electron charging of a dot. The spectra show clear level degeneracies in isolated quantum dots, supported by the first observation of predicted temperature-dependent shifts of Coulomb blockade peaks. Further, by scanning the surface we observe that several quantum dots may reside on what topologically appears to be just one. These images of grouped weakly and strongly coupled dots allow us to estimate their relative coupling strengths.
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and therefore the frequency, of the cantilever - ultimately setting a limit to the time resolution of experiments. Here we demonstrate optomechanical detection of low-mass, high-frequency nanomechanical cantilevers (up to 20 MHz) that surpass these limits, anticipating their use for single-molecule force measurements. These cantilevers achieve 2 fm / sqrt(Hz) displacement noise floors, and force sensitivity down to 132 aN / sqrt(Hz). Furthermore, the ability to resolve both in-plane and out-of-plane motion of our cantilevers opens the door for ultrasensitive multidimensional force spectroscopy, and optomechanical interactions, such as tuning of the cantilever frequency in situ, provide new opportunities in high-speed, high-resolution experiments.
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