A Theoretical Study of X-ray produced by the Plasma Focus device based on Sing Lee model

The Lee code is applied to characterize the plasma focus in two plasma focus devices UNU/ICTP PFF and Amirkabir plasma focus device (APF), and for optimizing the nitrogen soft x-ray yields based on bank, tubes and operating parameters. It is found that the soft x-ray yield increases with changing pressure until it reaches the maximum value for each plasma focus device, with keeping the bank parameters, operational voltage unchanged but systematically changing other parameters.

Numerical study of soft x-ray yield in two dense plasma focus devices based on Lee code, and comparing it with experimental results using neon filling gas

In this work we carried out some numerical experiments on NX2, UNU/ICTP PFF dense plasma focus device with neon filling gas using Lee code version (RADPFV5.15de.c1) and standard parameters of the devices to compare the value of the soft x-ray yield (Ysxr) emitting from each one. Also we studied the influence some factors on the value of (Ysxr).