The Lee code is applied to characterize the plasma focus in two
plasma focus devices UNU/ICTP PFF and Amirkabir plasma focus
device (APF),
and for optimizing the nitrogen soft x-ray yields based on bank,
tubes and operating parameters. It is foun
d that the soft x-ray yield
increases with changing pressure until it reaches the maximum
value for each plasma focus device, with keeping the bank
parameters, operational voltage unchanged but systematically
changing other parameters.
In this work we carried out some numerical experiments on NX2,
UNU/ICTP PFF dense plasma focus device with neon filling gas using Lee
code version (RADPFV5.15de.c1) and standard parameters of the devices
to compare the value of the soft x-ray yiel
d (Ysxr) emitting from each one.
Also we studied the influence some factors on the value of (Ysxr).