We present a PC controlled apparatus, we have built up to measure
automatically forward electrical characteristics and capacity versus voltage
characteristics, of schottky diodes. Methods used to extract electrical
parameters of these diodes (leak
age current, Schottky barrier height and
substrat doping concentration) are described. These methods were applied to a
commercial Schottky diode, used as Alpha particles detector (surface barrier
detector), and the obtained results were compatible with the expected ones.
