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Since S-parameter measurements without uncertainty cannot claim any credibility, the uncertainties in full two-port Vector Network Analyser (VNA) measurements were estimated using total complex differentials (Total Differential Errors). To express precisely a comparison relation between complex differential errors, their differential error regions (DERs) were used. To demonstrate the method in the most accurate case of a direct zero-length thru, practical results are presented for commonly used Z-parameters of a simple, two-port, DC resistive T-network, which was built and tested against frequency with a VNA measurement system extended by two lengthy transmission lines.
The objective was to study uncertainty in antenna input impedance resulting from full one-port Vector Network Analyzer (VNA) measurements. The VNA process equation in the reflection coefficient p of a load, its measurement m and three errors Es -dete
An analytical method was developed to estimate errors in quantities depended on full one-port vector network analyser (VNA) measurements using differentials and a complex differential error region (DER) was defined. To evaluate the method, difference
Utilizing the effect of losses, we show that symmetric 3-port devices exhibit coherent perfect absorption of waves and we provide the corresponding conditions on the reflection and transmission coefficients. Infinite combinations of asymmetric inputs
An analytical method was developed, to estimate uncertainties in full two-port Vector Network Analyzer measurements, using total differentials of S-parameters. System error uncertainties were also estimated from total differentials involving two trip
In order to measure the total cross section for thermal neutrons, a photoneutron source (PNS, phase 1) has been developed for the acquisition of nuclear data for the Thorium Molten Salt Reactor (TMSR) at the Shanghai Institute of Applied Physics (SIN