اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدDiscrete structure of ultrathin dielectric films and their surface optical properties
342
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
The boundary problem of linear classical optics about the interaction of electromagnetic radiation with a thin dielectric film has been solved under explicit consideration of its discrete structure. The main attention has been paid to the investigation of the near-zone optical response of dielectrics. The laws of reflection and refraction for discrete structures in the case of a regular atomic distribution are studied and the structure of evanescent harmonics induced by an external plane wave near the surface is investigated in details. It is shown by means of analytical and numerical calculations that due to the existence of the evanescent harmonics the laws of reflection and refraction at the distances from the surface less than two interatomic distances are principally different from the Fresnel laws. From the practical point of view the results of this work might be useful for the near-field optical microscopy of ultrahigh resolution.
قيم البحث
اقرأ أيضاً
Recent studies have shown convolutional neural networks (CNNs) can be trained to perform modal decomposition using intensity images of optical fields. A fundamental limitation of these techniques is that the modal phases can not be uniquely calculate
d using a single intensity image. The knowledge of modal phases is crucial for wavefront sensing, alignment and mode matching applications. Heterodyne imaging techniques can provide images of the transverse complex amplitude & phase profile of laser beams at high resolutions and frame rates. In this work we train a CNN to perform modal decomposition using simulated heterodyne images, allowing the complete modal phases to be predicted. This is to our knowledge the first machine learning decomposition scheme to utilize complex phase information to perform modal decomposition. We compare our network with a traditional overlap integral & center-of-mass centering algorithm and show that it is both less sensitive to beam centering and on average more accurate.
The finite-difference time-domain (FDTD) method is employed to solve the three dimensional Maxwell equation for the situation of near-field microscopy using a sub-wavelength aperture. Experimental result on unexpected high spatial resolution is reproduced by our computer simulation.
Engraving trenches on the surfaces of ultrathin ferroelectric (FE) films and superlattices promises control over the orientation and direction of FE domain walls (DWs). Through exploiting the phenomenon of DW-surface trench (ST) parallel alignment, s
ystems where DWs are known for becoming electrical conductors could now become useful nanocircuits using only standard lithographical techniques. Despite this clear application, the microscopic mechanism responsible for the alignment phenomenon has remained elusive. Using ultrathin PbTiO$_3$ films as a model system, we explore this mechanism with large scale density functional theory simulations on as many as 5,136 atoms. Although we expect multiple contributing factors, we show that parallel DW-ST alignment can be well explained by this configuration giving rise to an arrangement of electric dipole moments which best restore polar continuity to the film. These moments preserve the polar texture of the pristine film, thus minimizing ST-induced depolarizing fields. Our simulations also support experimental observations of ST-induced negative strains which have been suggested to play a role in the alignment mechanism.
Optical limiters are nonlinear devices that feature decreasing transmittance with increasing incident optical intensity, and thus can protect sensitive components from high-intensity illumination. The ideal optical limiter reflects rather than absorb
s light in its active (limiting) state, minimizing risk of damage to the limiter itself. Previous efforts to realize reflective limiters were based on embedding nonlinear layers into relatively thick multilayer photonic structures, resulting in substantial fabrication complexity, reduced speed and, in some instances, limited working bandwidth. We overcome these tradeoffs by using the insulator-to-metal transition in vanadium dioxide (VO2) to achieve intensity-dependent modulation of resonant transmission through aperture antennas. Due to the dramatic change of optical properties across the insulator-to-metal transition, low-quality-factor resonators were sufficient to achieve high on-off ratios in device transmittance. As a result, our ultra-thin reflective limiter (thickness ~1/100 of the free-space wavelength) is broadband in terms of operating wavelength (> 2 um at 10 um) and angle of incidence (up to ~50$deg$ away from the normal).
Black phosphorus (BP) is an emerging two-dimensional semiconducting material with great potential for nanoelectronic and nanophotonic applications, especially owing to its unique anisotropic electrical and optical properties. Many theoretical studies
have predicted the anisotropic optical properties of BP, but the direct experimental quantification remains challenging. The difficulties stem from the ease of BPs degradation when exposed to air in ambient conditions, and from the indirect nature of conventional approaches that are subject to large measurement uncertainties. This work reports a direct investigation of the birefringent optical constants of micrometer-thick BP samples with picosecond (ps) interferometry, over the wavelength range from 780 to 890 nm. In this ps-interferometry approach, an ultrathin (5 nm) platinum layer for launching acoustic waves naturally protects the BP flake from degradation. The birefringent optical constants of BP for light polarization along the two primary crystalline orientations, zigzag and armchair, are directly obtained via fitting the attenuated Brillouin scattering signals. A bi-exponential model is further proposed to analyze the BS signals for a random incident light polarization. The BP experimental results and the associated measurement sensitivity analysis demonstrate the reliability and accuracy of the ps-interferometry approach for capturing the polarization-dependent optical properties of birefringent materials.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
