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In this paper, we explore the slot tagging with only a few labeled support sentences (a.k.a. few-shot). Few-shot slot tagging faces a unique challenge compared to the other few-shot classification problems as it calls for modeling the dependencies between labels. But it is hard to apply previously learned label dependencies to an unseen domain, due to the discrepancy of label sets. To tackle this, we introduce a collapsed dependency transfer mechanism into the conditional random field (CRF) to transfer abstract label dependency patterns as transition scores. In the few-shot setting, the emission score of CRF can be calculated as a words similarity to the representation of each label. To calculate such similarity, we propose a Label-enhanced Task-Adaptive Projection Network (L-TapNet) based on the state-of-the-art few-shot classification model -- TapNet, by leveraging label name semantics in representing labels. Experimental results show that our model significantly outperforms the strongest few-shot learning baseline by 14.64 F1 scores in the one-shot setting.
While few-shot classification has been widely explored with similarity based methods, few-shot sequence labeling poses a unique challenge as it also calls for modeling the label dependencies. To consider both the item similarity and label dependency,
Metric-based learning is a well-known family of methods for few-shot learning, especially in computer vision. Recently, they have been used in many natural language processing applications but not for slot tagging. In this paper, we explore metric-ba
Zero-shot learning transfers knowledge from seen classes to novel unseen classes to reduce human labor of labelling data for building new classifiers. Much effort on zero-shot learning however has focused on the standard multi-class setting, the more
Few-shot learning arises in important practical scenarios, such as when a natural language understanding system needs to learn new semantic labels for an emerging, resource-scarce domain. In this paper, we explore retrieval-based methods for intent c
Partial-label learning (PLL) generally focuses on inducing a noise-tolerant multi-class classifier by training on overly-annotated samples, each of which is annotated with a set of labels, but only one is the valid label. A basic promise of existing