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Electric-field noise near surfaces is a common problem in diverse areas of physics, and a limiting factor for many precision measurements. There are multiple mechanisms by which such noise is generated, many of which are poorly understood. Laser-cooled, trapped ions provide one of the most sensitive systems to probe electric-field noise at MHz frequencies and over a distance range 30 - 3000 $mu$m from the surface. Over recent years numerous experiments have reported spectral densities of electric-field noise inferred from ion heating-rate measurements and several different theoretical explanations for the observed noise characteristics have been proposed. This paper provides an extensive summary and critical review of electric-field noise measurements in ion traps, and compares these experimental findings with known and conjectured mechanisms for the origin of this noise. This reveals that the presence of multiple noise sources, as well as the different scalings added by geometrical considerations, complicate the interpretation of these results. It is thus the purpose of this review to assess which conclusions can be reasonably drawn from the existing data, and which important questions are still open. In so doing it provides a framework for future investigations of surface-noise processes.
Scaling up trapped-ion quantum computers requires new trap materials to be explored. Here, we present experiments with a surface ion trap made from the high-temperature superconductor YBCO, a promising material for future trap designs. We show that v
We investigate anomalous ion-motional heating, a limitation to multi-qubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multi-zone surface-electrode trap in which ions can be held at five disc
We probe electric-field noise near the metal surface of an ion trap chip in a previously unexplored high-temperature regime. We observe a non-trivial temperature dependence with the noise amplitude at 1-MHz frequency saturating around 500~K. Measurem
We probe electric-field noise in a surface ion trap for ion-surface distances $d$ between 50 and 300 $mumathrm{m}$ in the normal and planar directions. We find the noise distance dependence to scale as $d^{-2.6}$ in our trap and a frequency dependenc
We aim to illuminate how the microscopic properties of a metal surface map to its electric-field noise characteristics. In our system, prolonged heat treatments of a metal film can induce a rise in the magnitude of the electric-field noise generated