Coexistence of ferromagnetic and superconducting orders and their interplay in ferromagnet-superconductor heterostructures is a topic of intense research. While it is well known that proximity of a ferromagnet suppresses superconducting order in the
superconductor, there exist few studies indicating the proximity of a superconductor suppressing ferromagnetic order in a ferromagnet. Here we demonstrate a rare observation of the suppression of ferromagnetic order in a LaCaMnO3 layer separated from a YBa2Cu3O7-{delta} layer by a thin insulator (SrTiO3). Polarized neutron reflectivity measurements on LaCaMnO3SrTiO3YBa2Cu3O7-{delta} trilayer deposited on [001] SrTiO3 single crystal substrates shows the emergence of a thin magnetic dead layer in LaCaMnO3 adjacent to the insulating layer below its superconducting transition temperature of YBa2Cu3O7-{delta}. Further, the magnetic dead layer grows in thickness when the insulating layer is made thinner. This indicates a possible tunneling of the superconducting order-parameter through the insulating SrTiO3 inducing modulation of magnetization in LaCaMnO3.
We measured the temperature dependence of the saturation magnetization (Ms) of a (La1-xPrx)1-yCayMnO3 (x ~ 0.60, y ~ 0.33) film as a function of applied bending stress. Stress producing a compressive strain of -0.01% along the magnetic easy axis incr
eased the Curie temperature by ~6 K and the metal-insulator-transition by ~4 K. Regardless of whether or not stress is applied to the film, magnetic ordering occurs at temperatures significantly higher than the metal-insulator-transition temperature. The magnetization of the sample at the temperature of the metal-insulator-transition is approximately the site percolation threshold for a two-dimensional spin lattice.
We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.60pm0.04, y = 0.20pm0.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient rela
ting strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film.
We measured the chemical and magnetic depth profiles of a single crystalline (La$_{1-x}$Pr$_x$)$_{1-y}$Ca$_y$MnO$_{3-{delta}}$ (x = 0.52pm0.05, y = 0.23pm0.04, {delta} = 0.14pm0.10) film grown on a NdGaO3 substrate using x-ray reflectometry, electron
microscopy, electron energy-loss spectroscopy and polarized neutron reflectometry. Our data indicate that the film exhibits coexistence of different magnetic phases as a function of depth. The magnetic depth profile is correlated with a variation of chemical composition with depth. The thermal hysteresis of ferromagnetic order in the film suggests a first order ferromagnetic transition at low temperatures.
We present a detailed study of the interface morphology of an electro-deposited (ED) Ni/Cu bilayer film by using off-specular (diffuse) neutron reflectivity technique and Atomic Force Microscopy (AFM). The Ni/Cu bilayer has been electro-deposited on
seed layers of Ti/Cu. These two seed layers were deposited by magnetron sputtering. The depth profile of density in the sample has been obtained from specular neutron reflectivity data. AFM image of the air-film interface shows that the surface is covered by globular islands of different sizes. The AFM height distribution of the surface clearly shows two peaks [Fig. 3] and the relief structure (islands) on the surface in the film can be treated as a quasi-two-level random rough surface structure. We have demonstrated that the detailed morphology of air-film interfaces, the quasi-two level surface structure as well as morphology of the buried interfaces can be obtained from off-specular neutron reflectivity data. We have shown from AFM and off-specular neutron reflectivity data that the morphologies of electro-deposited surface is distinctly different from that of sputter-deposited interface in this sample. To the best of our knowledge this is the first attempt to microscopically quantify the differences in morphologies of metallic interfaces deposited by two different techniques viz. electro-deposition and sputtering.
