Here we report on the dynamics of the structural order parameter in a chromium film using synchrotron radiation in response to photo-induced ultra-fast excitations. Following transient optical excitations the effective lattice temperature of the film
rises close to the N{e}el temperature and the charge density wave (CDW) amplitude is reduced. Although we expect the electronic charge ordering to vanish shortly after the excitation we observe that the CDW is never completely disrupted, which is revealed by its unmodified period at elevated temperatures. We attribute the persistence of the CDW to the long-lived periodic lattice displacement in chromium. The long-term evolution shows that the CDW revives to its initial strength within 1 ns, which appears to behave in accordance with the temperature dependence in equilibrium. This study highlights the fundamental role of the lattice distortion in charge ordered systems and its impact on the re-condensation dynamics of the charge ordered state in strongly correlated materials.
We present a method to characterize the spatial coherence of soft X-ray radiation from a single diffraction pattern. The technique is based on scattering from non-redundant arrays (NRA) of slits and records the degree of spatial coherence at several
relative separations from one to 15 microns, simultaneously. Using NRAs we measured the transverse coherence of the X-ray beam at the XUV X-ray beamline P04 of the PETRA III synchrotron storage ring as a function of different beam parameters. To verify the results obtained with the NRAs additional Youngs double pinhole experiments were conducted and show good agreement.
We report on measurements of second-order intensity correlations at the high brilliance storage ring PETRA III using a prototype of the newly developed Adaptive Gain Integrating Pixel Detector (AGIPD). The detector recorded individual synchrotron rad
iation pulses with an x-ray photon energy of 14.4 keV and repetition rate of about 5 MHz. The second-order intensity correlation function was measured simultaneously at different spatial separations that allowed to determine the transverse coherence length at these x-ray energies. The measured values are in a good agreement with theoretical simulations based on the Gaussian Schell-model.
We present an x-ray study of liquid crystal membranes in the vicinity of hexatic-smectic phase transition by means of angular x-ray cross-correlation analysis (XCCA). By applying two-point angular intensity cross-correlation functions to the measured
series of diffraction patterns the parameters of bond-orientational (BO) order in hexatic phase were directly determined. The temperature dependence of the positional correlation lengths was analyzed as well. The obtained correlation lengths show larger values for the higher-order Fourier components of BO order. These findings indicate a strong coupling between BO and positional order that has not been studied in detail up to now.
An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optic
al element. In particular, here we consider Gaussian Schell-model beams and thin optical elements. Limiting cases of incoherent and fully coherent illumination of the focusing element are discussed. The effect of the beam defining aperture, typically used in combination with focusing elements at synchrotron sources to improve transverse coherence, is also analyzed in detail. As an example the coherence properties in the focal region of compound refractive lenses at the PETRA III synchrotron source are analyzed.
We present measurements of second- and higher-order intensity correlation functions (so-called Hanbury Brown and Twiss experiment) performed at the free-electron laser (FEL) FLASH in the non-linear regime of its operation. We demonstrate the high tra
nsverse coherence properties of the FEL beam with a degree of transverse coherence of about 80% and degeneracy parameter of the order 10^9 that makes it similar to laser sources. Intensity correlation measurements in spatial and frequency domain gave an estimate of the FEL average pulse duration of 50 fs. Our measurements of the higher-order correlation functions indicate that FEL radiation obeys Gaussian statistics, which is characteristic to chaotic sources.
The experimental characterization of the spatial and temporal coherence properties of the free-electron laser in Hamburg (FLASH) at a wavelength of 8.0 nm is presented. Double pinhole diffraction patterns of single femtosecond pulses focused to a siz
e of about 10 microns by 10 microns were measured. A transverse coherence length of 6.2 microns in the horizontal and 8.7 microns in the vertical direction was determined from the most coherent pulses. Using a split and delay unit the coherence time of the pulses produced in the same operation conditions of FLASH was measured to be 1.75 fs. From our experiment we estimated the degeneracy parameter of the FLASH beam to be on the order of $10^{10}$ to $10^{11}$, which exceeds the values of this parameter at any other source in the same energy range by many orders of magnitude.
A general theoretical approach based on the results of statistical optics is used for the analysis of the transverse coherence properties of 3-rd generation synchrotron sources and x-ray free-electron lasers (XFEL). Correlation properties of the wave
fields are calculated at different distances from an equivalent Gaussian Schell-model source. This model is used to describe coherence properties of the five meter undulator source at the synchrotron storage ring PETRA III. In the case of XFEL sources the decomposition of the statistical fields into a sum of independently propagating transverse modes is used for the analysis of the coherence properties of these new sources. A detailed calculation is performed for the parameters of the SASE1 undulator at the European XFEL. It is demonstrated that only a few modes contribute significantly to the total radiation field of that source.
