No Arabic abstract
Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM$_{110}$ deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of $814pm2$ pA, the root-mean-square transverse normalized emittance of the electron pulses is $varepsilon_{n,x}=(2.7pm0.1)cdot 10^{-12}$ m rad in the direction parallel to the streak of the cavity, and $varepsilon_{n,y}=(2.5pm0.1)cdot 10^{-12}$ m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is $varepsilon_{n,x}=varepsilon_{n,y}=(2.5pm0.1)cdot 10^{-12}$ m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of $0.95pm0.05$ eV has been measured.
This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate of 75 MHz based on a single compact resonant microwave cavity operating in dual mode. This elliptical cavity supports two orthogonal TM$_{110}$ modes with different resonance frequencies that are driven independently. The microwave signals used to drive the two cavity modes are generated from higher harmonics of the same Ti:Sapphire laser oscillator. Therefore the modes are accurately phase-locked, resulting in periodic transverse deflection of electrons described by a Lissajous pattern. By sending the periodically deflected beam through an aperture, ultrashort electron pulses are created at a repetition rate of 75 MHz. Electron pulses with $tau=(750pm10)$ fs pulse duration are created with only $(2.4pm0.1)$ W of microwave input power; with normalized rms emittances of $epsilon_{n,x}=(2.1pm0.2)$ pm rad and $epsilon_{n,y}=(1.3pm0.2)$ pm rad for a peak current of $I_p=(0.4pm0.1)$ nA. This corresponds to an rms normalized peak brightness of $B_{np,textrm{rms}}=(7pm1)times10^6$ A/m$^2$ sr V, equal to previous measurements for the continuous beam. In addition, the FWHM energy spread of $Delta U = (0.90pm0.05)$ eV is also unaffected by the dual mode cavity. This allows for ultrafast pump-probe experiments at the same spatial resolution of the original TEM in which a 75 MHz Ti:Sapphire oscillator can be used for exciting the sample. Moreover, the dual mode cavity can be used as a streak camera or time-of-flight EELS detector with a dynamic range $>10^4$.
In the quest for dynamic multimodal probing of a materials structure and functionality, it is critical to be able to quantify the chemical state on the atomic and nanoscale using element specific electronic and structurally sensitive tools such as electron energy loss spectroscopy (EELS). Ultrafast EELF, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photo excited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe the state of the art experimental techniques in this emerging field and its major uses and future applications.
We present a comprehensive study of internal quality factors in superconducting stub-geometry 3-dimensional cavities made of aluminum. We use wet etching, annealing and electrochemichal polishing to improve the as machined quality factor. We find that the dominant loss channel is split between two-level system loss and an unknown source with 60:40 proportion. A total of 17 cavities of different purity, resonance frequency and size were studied. Our treatment results in reproducible cavities, with ten of them showing internal quality factors above 80 million at a power corresponding to an average of a single photon in the cavity. The best cavity has an internal quality factor of 115 million at single photon level.
Microwave cavities oscillating in the TM$_{110}$ mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric material it becomes more compact and power efficient, facilitating the implementation in an electron microscope. However, the incorporation of the dielectric material makes the manufacturing process more difficult. Presented here are the steps taken to characterize the dielectric material, and to reproducibly fabricate dielectric filled cavities. Also presented are t
We present the development of the first ultrafast transmission electron microscope (UTEM) driven by localized photoemission from a field emitter cathode. We describe the implementation of the instrument, the photoemitter concept and the quantitative electron beam parameters achieved. Establishing a new source for ultrafast TEM, the Gottingen UTEM employs nano-localized linear photoemission from a Schottky emitter, which enables operation with freely tunable temporal structure, from continuous wave to femtosecond pulsed mode. Using this emission mechanism, we achieve record pulse properties in ultrafast electron microscopy of 9 {AA} focused beam diameter, 200 fs pulse duration and 0.6 eV energy width. We illustrate the possibility to conduct ultrafast imaging, diffraction, holography and spectroscopy with this instrument and also discuss opportunities to harness quantum coherent interactions between intense laser fields and free electron beams.