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Register a new userDual mode microwave deflection cavities for ultrafast electron microscopy
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This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate of 75 MHz based on a single compact resonant microwave cavity operating in dual mode. This elliptical cavity supports two orthogonal TM$_{110}$ modes with different resonance frequencies that are driven independently. The microwave signals used to drive the two cavity modes are generated from higher harmonics of the same Ti:Sapphire laser oscillator. Therefore the modes are accurately phase-locked, resulting in periodic transverse deflection of electrons described by a Lissajous pattern. By sending the periodically deflected beam through an aperture, ultrashort electron pulses are created at a repetition rate of 75 MHz. Electron pulses with $tau=(750pm10)$ fs pulse duration are created with only $(2.4pm0.1)$ W of microwave input power; with normalized rms emittances of $epsilon_{n,x}=(2.1pm0.2)$ pm rad and $epsilon_{n,y}=(1.3pm0.2)$ pm rad for a peak current of $I_p=(0.4pm0.1)$ nA. This corresponds to an rms normalized peak brightness of $B_{np,textrm{rms}}=(7pm1)times10^6$ A/m$^2$ sr V, equal to previous measurements for the continuous beam. In addition, the FWHM energy spread of $Delta U = (0.90pm0.05)$ eV is also unaffected by the dual mode cavity. This allows for ultrafast pump-probe experiments at the same spatial resolution of the original TEM in which a 75 MHz Ti:Sapphire oscillator can be used for exciting the sample. Moreover, the dual mode cavity can be used as a streak camera or time-of-flight EELS detector with a dynamic range $>10^4$.
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Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM$_{110}$ deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of $814pm2$ pA, the root-mean-square transverse normalized emittance of the electron pulses is $varepsilon_{n,x}=(2.7pm0.1)cdot 10^{-12}$ m rad in the direction parallel to the streak of the cavity, and $varepsilon_{n,y}=(2.5pm0.1)cdot 10^{-12}$ m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is $varepsilon_{n,x}=varepsilon_{n,y}=(2.5pm0.1)cdot 10^{-12}$ m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of $0.95pm0.05$ eV has been measured.
Microwave cavities oscillating in the TM$_{110}$ mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric material it becomes more compact and power efficient, facilitating the implementation in an electron microscope. However, the incorporation of the dielectric material makes the manufacturing process more difficult. Presented here are the steps taken to characterize the dielectric material, and to reproducibly fabricate dielectric filled cavities. Also presented are t
We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM$_{110}$ mode as dynamic optical elements for ultrafast electron microscopy. We first derive the optical transfer matrix of an ideal pillbox cavity and use a Courant-Snyder formalism to calculate the 6D phase space propagation of a Gaussian electron distribution through the cavity. We derive closed, analytic expressions for the increase in transverse emittance and energy spread of the electron distribution. We demonstrate that for the special case of a beam focused in the center of the cavity, the low emittance and low energy spread of a high quality beam can be maintained, which allows high-repetition rate, ultrafast electron microscopy with 100 fs temporal resolution combined with the atomic resolution of a high-end TEM. This is confirmed by charged particle tracking simulations using a realistic cavity geometry, including fringe fields at the cavity entrance and exit apertures.
In the quest for dynamic multimodal probing of a materials structure and functionality, it is critical to be able to quantify the chemical state on the atomic and nanoscale using element specific electronic and structurally sensitive tools such as electron energy loss spectroscopy (EELS). Ultrafast EELF, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photo excited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe the state of the art experimental techniques in this emerging field and its major uses and future applications.
One of the frontiers of modern electron scattering instrumentation is improving temporal resolution in order to enable the observation of dynamical phenomena at their fundamental time-scales. We analyze how a radiofrequency cavity can be used as an electron longitudinal lens in order to produce a highly magnified temporal replica of an ultrafast process, and, in combination with a deflecting cavity, enable streaked electron images of optical-frequency phenomena. We present start-to-end simulations of an MeV electron beamline for two variations of this idea (a `magnifying-glass and a `point-projection configuration) showing the feasibility for an electron probe to achieve single shot 1.4 fs(rms) temporal resolution.
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