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Design and characterization of dielectric filled TM$_{110}$ microwave cavities for ultrafast electron microscopy

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 Added by Wouter Verhoeven
 Publication date 2018
  fields Physics
and research's language is English




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Microwave cavities oscillating in the TM$_{110}$ mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric material it becomes more compact and power efficient, facilitating the implementation in an electron microscope. However, the incorporation of the dielectric material makes the manufacturing process more difficult. Presented here are the steps taken to characterize the dielectric material, and to reproducibly fabricate dielectric filled cavities. Also presented are t



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This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate of 75 MHz based on a single compact resonant microwave cavity operating in dual mode. This elliptical cavity supports two orthogonal TM$_{110}$ modes with different resonance frequencies that are driven independently. The microwave signals used to drive the two cavity modes are generated from higher harmonics of the same Ti:Sapphire laser oscillator. Therefore the modes are accurately phase-locked, resulting in periodic transverse deflection of electrons described by a Lissajous pattern. By sending the periodically deflected beam through an aperture, ultrashort electron pulses are created at a repetition rate of 75 MHz. Electron pulses with $tau=(750pm10)$ fs pulse duration are created with only $(2.4pm0.1)$ W of microwave input power; with normalized rms emittances of $epsilon_{n,x}=(2.1pm0.2)$ pm rad and $epsilon_{n,y}=(1.3pm0.2)$ pm rad for a peak current of $I_p=(0.4pm0.1)$ nA. This corresponds to an rms normalized peak brightness of $B_{np,textrm{rms}}=(7pm1)times10^6$ A/m$^2$ sr V, equal to previous measurements for the continuous beam. In addition, the FWHM energy spread of $Delta U = (0.90pm0.05)$ eV is also unaffected by the dual mode cavity. This allows for ultrafast pump-probe experiments at the same spatial resolution of the original TEM in which a 75 MHz Ti:Sapphire oscillator can be used for exciting the sample. Moreover, the dual mode cavity can be used as a streak camera or time-of-flight EELS detector with a dynamic range $>10^4$.
Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM$_{110}$ deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of $814pm2$ pA, the root-mean-square transverse normalized emittance of the electron pulses is $varepsilon_{n,x}=(2.7pm0.1)cdot 10^{-12}$ m rad in the direction parallel to the streak of the cavity, and $varepsilon_{n,y}=(2.5pm0.1)cdot 10^{-12}$ m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is $varepsilon_{n,x}=varepsilon_{n,y}=(2.5pm0.1)cdot 10^{-12}$ m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of $0.95pm0.05$ eV has been measured.
We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM$_{110}$ mode as dynamic optical elements for ultrafast electron microscopy. We first derive the optical transfer matrix of an ideal pillbox cavity and use a Courant-Snyder formalism to calculate the 6D phase space propagation of a Gaussian electron distribution through the cavity. We derive closed, analytic expressions for the increase in transverse emittance and energy spread of the electron distribution. We demonstrate that for the special case of a beam focused in the center of the cavity, the low emittance and low energy spread of a high quality beam can be maintained, which allows high-repetition rate, ultrafast electron microscopy with 100 fs temporal resolution combined with the atomic resolution of a high-end TEM. This is confirmed by charged particle tracking simulations using a realistic cavity geometry, including fringe fields at the cavity entrance and exit apertures.
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Ultrafast electron diffraction (UED) is a powerful method for studying time-resolved structural changes. Currently, space charge induced temporal broadening prevents obtaining high brightness electron pulses with sub-100 fs durations limiting the range of phenomena that can be studied with this technique. We review the state of the the art of UED in this respect and propose a practical design for reflectron based pulse compression which utilizes only electro-static optics and has a tunable temporal focal point. Our simulation shows that this scheme is capable of compressing an electron pulse containing 100,000 electrons with 60:1 temporal compression ratio.
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