Subscribe to the gold package and get unlimited access to Shamra Academy
Register a new userChangeChip: A Reference-Based Unsupervised Change Detection for PCB Defect Detection
65
0
0.0
(
0
)
Added by
Yehonatan Fridman
Publication date
2021
fields
Informatics Engineering
and research's language is
English
Ask ChatGPT about the research
No Arabic abstract
The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.
rate research
Read More
The defect detection task can be regarded as a realistic scenario of object detection in the computer vision field and it is widely used in the industrial field. Directly applying vanilla object detector to defect detection task can achieve promising results, while there still exists challenging issues that have not been solved. The first issue is the texture shift which means a trained defect detector model will be easily affected by unseen texture, and the second issue is partial visual confusion which indicates that a partial defect box is visually similar with a complete box. To tackle these two problems, we propose a Reference-based Defect Detection Network (RDDN). Specifically, we introduce template reference and context reference to against those two problems, respectively. Template reference can reduce the texture shift from image, feature or region levels, and encourage the detectors to focus more on the defective area as a result. We can use either well-aligned template images or the outputs of a pseudo template generator as template references in this work, and they are jointly trained with detectors by the supervision of normal samples. To solve the partial visual confusion issue, we propose to leverage the carried context information of context reference, which is the concentric bigger box of each region proposal, to perform more accurate region classification and regression. Experiments on two defect detection datasets demonstrate the effectiveness of our proposed approach.
Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving $98.6%$ mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.
This paper presents a challenging computer vision task, namely the detection of generic components on a PCB, and a novel set of deep-learning methods that are able to jointly leverage the appearance of individual components and the propagation of information across the structure of the board to accurately detect and identify various types of components on a PCB. Due to the expense of manual data labeling, a highly unbalanced distribution of component types, and significant domain shift across boards, most earlier attempts based on traditional image processing techniques fail to generalize well to PCB images with various quality, lighting conditions, etc. Newer object detection pipelines such as Faster R-CNN, on the other hand, require a large amount of labeled data, do not deal with domain shift, and do not leverage structure. To address these issues, we propose a three stage pipeline in which a class-agnostic region proposal network is followed by a low-shot similarity prediction classifier. In order to exploit the data dependency within a PCB, we design a novel Graph Network block to refine the component features conditioned on each PCB. To the best of our knowledge, this is one of the earliest attempts to train a deep learning based model for such tasks, and we demonstrate improvements over recent graph networks for this task. We also provide in-depth analysis and discussion for this challenging task, pointing to future research.
This paper presents a novel semantic scene change detection scheme with only weak supervision. A straightforward approach for this task is to train a semantic change detection network directly from a large-scale dataset in an end-to-end manner. However, a specific dataset for this task, which is usually labor-intensive and time-consuming, becomes indispensable. To avoid this problem, we propose to train this kind of network from existing datasets by dividing this task into change detection and semantic extraction. On the other hand, the difference in camera viewpoints, for example, images of the same scene captured from a vehicle-mounted camera at different time points, usually brings a challenge to the change detection task. To address this challenge, we propose a new siamese network structure with the introduction of correlation layer. In addition, we create a publicly available dataset for semantic change detection to evaluate the proposed method. The experimental results verified both the robustness to viewpoint difference in change detection task and the effectiveness for semantic change detection of the proposed networks. Our code and dataset are available at https://github.com/xdspacelab/sscdnet.
Surface defect detection plays an increasingly important role in manufacturing industry to guarantee the product quality. Many deep learning methods have been widely used in surface defect detection tasks, and have been proven to perform well in defects classification and location. However, deep learning-based detection methods often require plenty of data for training, which fail to apply to the real industrial scenarios since the distribution of defect categories is often imbalanced. In other words, common defect classes have many samples but rare defect classes have extremely few samples, and it is difficult for these methods to well detect rare defect classes. To solve the imbalanced distribution problem, in this paper we propose TL-SDD: a novel Transfer Learning-based method for Surface Defect Detection. First, we adopt a two-phase training scheme to transfer the knowledge from common defect classes to rare defect classes. Second, we propose a novel Metric-based Surface Defect Detection (M-SDD) model. We design three modules for this model: (1) feature extraction module: containing feature fusion which combines high-level semantic information with low-level structural information. (2) feature reweighting module: transforming examples to a reweighting vector that indicates the importance of features. (3) distance metric module: learning a metric space in which defects are classified by computing distances to representations of each category. Finally, we validate the performance of our proposed method on a real dataset including surface defects of aluminum profiles. Compared to the baseline methods, the performance of our proposed method has improved by up to 11.98% for rare defect classes.
Log in to be able to interact and post comments
comments
Fetching comments
Sign in to be able to follow your search criteria
