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Register a new userSystematic manipulation of the surface conductivity of SmB$_6$
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We show that the resistivity plateau of SmB$_6$ at low temperature, typically taken as a hallmark of its conducting surface state, can systematically be influenced by different surface treatments. We investigate the effect of inflicting an increasing number of hand-made scratches and microscopically defined focused ion beam-cut trenches on the surfaces of flux-grown Sm$_{1-x}$Gd$_x$B$_6$ with $x =$ 0, 0.0002. Both treatments increase the resistance of the low-temperature plateau, whereas the bulk resistance at higher temperature largely remains unaffected. Notably, the temperature at which the resistance deviates from the thermally activated behavior decreases with cumulative surface damage. These features are more pronounced for the focused ion beam treated samples, with the difference likely being related to the absence of microscopic defects like subsurface cracks. Therefore, our method presents a systematic way of controlling the surface conductance.
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Possible existence of topologically protected surface in samarium hexaboride has created a strong need for investigations allowing to distinguish between properties coming from the surface states and those originating in the (remaining) bulk. Studies of SmB6 thin films represent a favorable approach allowing well defined variations of the bulk volume that is not affected by surface states. Moreover, thin films are highly desirable for potential technology applications. However, the growth of SmB6 thin films is accompanied by technology problems, which are typically associated with maintaining the correct stoichiometry of samarium and boron. Here we present feasibility study of SmB6 thin film synthesis by pulsed laser deposition (PLD) from a single stoichiometric SmB6 target. As proved by Rutherford Backscattering Spectrometry (RBS), we succeeded to obtain the same ratio of samarium and boron in the films as that in the target. Thin films revealing characteristic electrical properties of (crystalline) SmB6 were successfully deposited on MgO, sapphire, and glass-ceramics substrates, when the substrates were kept at temperature of 600$^circ$ C during the deposition. Performed electrical resistance studies have revealed that bulk properties of the films are only slightly affected by the substrate. Our results indicate that PLD is a suitable method for complex and intensive research of SmB6 and similar systems.
We investigate flux-grown Sm-deficient Sm$_x$B$_6$ ($x < 1$) by global and local tools, including X-ray diffraction (XRD), electronic transport, and scanning tunneling microscopy (STM) and spectroscopy (STS). All these tools indicate a remarkable persistence of the SmB$_6$ local structure in the flux-grown samples even for nominal Sm concentrations as low as $x=0.75$. As a consequence, the overall electronic properties of Sm$_x$B$_6$, and particularly the surface conductance at low temperature, is only affected locally by the Sm-deficiency.
After the theoretical prediction that SmB$_6$ is a topological Kondo insulator, there has been an explosion of studies on the SmB$_6$ surface. However, there is not yet an agreement on even the most basic quantities such as the surface carrier density and mobility. In this paper, we carefully revisit Corbino disk magnetotransport studies to find those surface transport parameters. We first show that subsurface cracks exist in the SmB$_6$ crystals, arising both from surface preparation and during the crystal growth. We provide evidence that these hidden subsurface cracks are additional conduction channels, and the large disagreement between earlier surface SmB$_6$ studies may originate from previous interpretations not taking this extra conduction path into account. We provide an update of a more reliable magnetotransport data than the previous one (Phys. Rev. B 92, 115110) and find that the orders-of-magnitude large disagreements in carrier density and mobility come from the surface preparation and the transport geometry rather than the intrinsic sample quality. From this magnetotransport study, we find an updated estimate of the carrier density and mobility of 2.71$times$10$^{13}$ (1/cm$^2$) and 104.5 (cm$^{2}$/V$cdot$sec), respectively. We compare our results with other studies of the SmB$_6$ surface. By this comparison, we provide insight into the disagreements and agreements of the previously reported angle-resolved photoemission spectroscopy, scanning tunneling microscopy, and magnetotorque quantum oscillations measurements.
The impact of non-magnetic and magnetic impurities on topological insulators is a central problem concerning their fundamental physics and possible novel spintronics and quantum computing applications. SmB$_6$, predicted to be a topological Kondo insulator, is considered a benchmark material. Using a spin-polarized tip in scanning tunneling spectroscopy destroys the signature peak of the topological surface state, revealing its spin texture. Further, combining local STS with macroscopic transport measurements on SmB$_6$ containing different substitutions enables us to investigate the effect of impurities. The surface states around impurities are locally suppressed with different length scales depending on their magnetic properties and, for sufficiently high impurity level, globally destroyed. Our study points directly to the topological nature of SmB$_6$, and unveils, microscopically and macroscopically, how impurities -- magnetic or non-magnetic -- affect topological surface states.
We study the transport properties of the Kondo insulator SmB$_6$ with a specialized configuration designed to distinguish bulk-dominated conduction from surface-dominated conduction. We find that as the material is cooled below 4 K, it exhibits a crossover from bulk to surface conduction with a fully insulating bulk. We take the robustness and magnitude of the surface conductivity, as is manifest in the literature of SmB$_6$, to be strong evidence for the topological insulator metallic surface states recently predicted for this material.
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