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Register a new userHigh-Resolution Non-Invasive X-ray Diffraction Analysis of Artists Paints
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Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored at high resolution at the Diamond Light Source synchrotron. The results of the XRD analysis of the pigments in 40 paints, commonly used by 20th century artists, are reported here. It was found that synthetic organic pigments yielded weak diffraction patterns at best, and it was not possible to unambiguously identify any of these pigments. In contrast, the majority of the paints containing inorganic pigments yielded good diffraction patterns amenable to crystallographic analysis. The high resolution of the technique enables the extraction of a range of detailed information: phase identification (including solid solutions), highly accurate unit cell parameters, phase quantification, crystallite size and strain parameters and preferred orientation parameters. The implications of these results for application to real paintings are discussed, along with the possibility to transfer the technique away from the synchrotron and into the laboratory and museum through the use of state-of-the-art microcalorimeter detectors. The results presented demonstrate the exciting potential of the technique for art history and authentication studies, based on the non-invasive acquisition of very high quality crystallographic data.
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Low power energy dispersive XRD-XRF portable instruments equipped with multiple angle scanning can take advantage of the shorter acquisition time of EDXRD with respect to ADXRD, and bring closer higher accuracy and resolution of inter-planar distance with those obtained by ADXRD. The data produced by this new hybrid configuration is correlated in the sense that a single XRF or XRD specimen appear in multiple spectra (the later shifted in energy for differing angles). Hence, for fully benefit from the richer data released by this configuration, the analysis should not be confined to the independent processing of the spectra, specialized hybrid data processing should be conceived. We previously reported some advances in the processing of the resulting 3D data (intensity, energy and angle). Here the analytical performance of the first hybrid angle-energy dispersive X-ray diffraction and fluorescence portable system is assessed for non-invasive surface mineral analysis of samples relevant for archaeometrical applications. We evaluate the performance on standard reference material and probe applicability of the methods so developed to identify stones (jadeite and omphacite), and pigments (Prussian blue) in the pictorial layer of modeled paintings. Discussion emphasize the improvement in accuracy of interplanar distance with respect to EDXRD taken at a single fixed angles, evaluate the resolution of AD/EDXRD data, and total acquisition time.
Axion helioscopes like the planned International Axion Observatory (IAXO) search for evidence of axions and axion-like particles (ALPs) from the Sun. A strong magnetic field is used to convert ALPs into photons via the generic ALP-photon coupling. To observe the resulting photons, X-ray detectors with low background and high efficiency are necessary. In addition, good energy resolution and low energy threshold would allow for investigating the ALP properties by studying the X-ray spectrum after its discovery. We propose to use low temperature metallic magnetic calorimeters (MMCs). Here we present the first detector system based on MMCs developed for IAXO and discuss the results of the characterization. The detector consists of a two-dimensional 64-pixel array covering an active area of 16 mm$^2$ with a fill factor of 93 %. We achieve an average energy resolution of 6.1 eV FWHM allowing for energy thresholds below 100 eV. This detector is the first step towards a larger 1 cm$^2$ array matching the IAXO X-ray optics. We determine the background rate for an unshielded detector system in the energy range between 1 keV and 10 keV to be $3.2(1) times 10^{-4}$ keV$^{-1}$ cm$^{-2}$ s$^{-1}$ from events acquired over 30 days. In the future, active and passive shields will significantly reduce the background induced by cosmic muons and natural radioactivity. Our results demonstrate that MMCs are a promising technology for helioscopes to discover and study ALPs.
We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $mu$s peaking time and a temperature of 248 K, an electronic resolution of 13- and 10 electrons rms was measured with and without a SDD sensor respectively. A spectral resolution of 170 eV FWHM at 5.9 keV was obtained with an $^{55}$Fe source. The channel linearity was better than $pm$ 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250 nm process with a footprint of 6.3 mm x 3.9 mm and dissipates 167 mW of static power.
We are preparing for an ultra-high resolution x-ray spectroscopy of kaonic atoms using an x-ray spectrometer based on an array of superconducting transition-edge-sensor microcalorimeters developed by NIST. The instrument has excellent energy resolutions of 2 - 3 eV (FWHM) at 6 keV and a large collecting area of about 20 mm^2. This will open new door to investigate kaon-nucleus strong interaction and provide new accurate charged-kaon mass value.
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.
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