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We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray field distribution of the tip MFM using a single nitrogen vacancy (NV) center in diamond. From the measured stray field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images in quantum calibrated stray field maps. This novel approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray field measurements in a field range inaccessible by scanning NV magnetometry. Quantum calibrated measurements of a stray field reference sample allow its use as a transfer standard opening the road towards fast and easily accessible quantum traceable calibration of virtually any MFM.
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The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{i}dal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods. a) present adress: ISIS, Univ.
A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary topography is discussed. A double phase-locked loop (PLL) system is used to mechanically excite a high quality factor cantilever under vacuum conditions on its first mode and via an oscillatory tip-sample potential on its second mode. The obtained second mode oscillation amplitude is then used as a proxy for the tip-sample distance, and for the control thereof. With appropriate $z$-feedback parameters two data sets reflecting the magnetic tip-sample interaction and the sample topography are simultaneously obtained.
We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP reference sample with traceably determined magnetization. A resolution of the magnetic moment of the order of 10^(-18) Am^2 under ambient conditions is demonstrated which is presently limited by the tips magnetic moment and the noise level of the instrument. The calibration scheme can be applied to practically any MFM and tip thus allowing a wide range of future applications e.g. in nanomagnetism and biotechnology.
While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electrostatic Discovery Atomic Force Microscopy, a machine learning based method which provides immediate quantitative maps of the electrostatic potential directly from Atomic Force Microscopy images with functionalized tips. We apply this to characterize the electrostatic properties of a variety of molecular systems and compare directly to reference simulations, demonstrating good agreement. This approach opens the door to reliable atomic scale electrostatic maps on any system with minimal computational overhead.
We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force. It features a simple implementation and faster scanning as it requires no low frequency modulation. We show that applying a coherent ac voltage with two times the cantilever oscillation frequency induces the dissipation signal proportional to the electrostatic force gradient which depends on the effective dc bias voltage including the contact potential difference. We demonstrate the KPFM images of a MoS$_2$ flake taken with the present method is in quantitative agreement with that taken with the frequency modulated Kelvin probe force microscopy technique.
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