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High-Fidelity, Single-Shot, Quantum-Logic-Assisted Readout in a Mixed-Species Ion Chain

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 Added by Colin Bruzewicz
 Publication date 2017
  fields Physics
and research's language is English




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We use a co-trapped ion ($^{88}mathrm{Sr}^{+}$) to sympathetically cool and measure the quantum state populations of a memory-qubit ion of a different atomic species ($^{40}mathrm{Ca}^{+}$) in a cryogenic, surface-electrode ion trap. Due in part to the low motional heating rate demonstrated here, the state populations of the memory ion can be transferred to the auxiliary ion by using the shared motion as a quantum state bus and measured with an average accuracy of 96(1)%. This scheme can be used in quantum information processors to reduce photon-scattering-induced error in unmeasured memory qubits.



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Determination of qubit initialisation and measurement fidelity is important for the overall performance of a quantum computer. However, the method by which it is calculated in semiconductor qubits varies between experiments. In this paper we present a full theoretical analysis of electronic single-shot readout and describe critical parameters to achieve high fidelity readout. In particular, we derive a model for energy selective state readout based on a charge detector response and examine how to optimise the fidelity by choosing correct experimental parameters. Although we focus on single electron spin readout, the theory presented can be applied to other electronic readout techniques in semiconductors that use a reservoir.
We implement a two-qubit logic gate between a $^{43}mathrm{Ca}^+,$ hyperfine qubit and a $^{88}mathrm{Sr}^+,$ Zeeman qubit. For this pair of ion species, the S--P optical transitions are close enough that a single laser of wavelength $402,mathrm{nm}$ can be used to drive the gate, but sufficiently well separated to give good spectral isolation and low photon scattering errors. We characterize the gate by full randomized benchmarking, gate set tomography and Bell state analysis. The latter method gives a fidelity of $99.8(1)%$, comparable to that of the best same-species gates and consistent with known sources of error.
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High fidelity single-shot readout of qubits is a crucial component for fault-tolerant quantum computing and scalable quantum networks. In recent years, the nitrogen-vacancy (NV) center in diamond has risen as a leading platform for the above applications. The current single-shot readout of the NV electron spin relies on resonance fluorescence method at cryogenic temperature. However, the the spin-flip process interrupts the optical cycling transition, therefore, limits the readout fidelity. Here, we introduce a spin-to-charge conversion method assisted by near-infrared (NIR) light to suppress the spin-flip error. This method leverages high spin-selectivity of cryogenic resonance excitation and high flexibility of photonionization. We achieve an overall fidelity $>$ 95% for the single-shot readout of an NV center electron spin in the presence of high strain and fast spin-flip process. With further improvements, this technique has the potential to achieve spin readout fidelity exceeding the fault-tolerant threshold, and may also find applications on integrated optoelectronic devices.
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