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Register a new userA Reassessment of Absolute Energies of the X-ray L Lines of Lanthanide Metals
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We introduce a new technique for determining x-ray fluorescence line energies and widths, and we present measurements made with this technique of 22 x-ray L lines from lanthanide-series elements. The technique uses arrays of transition-edge sensors, microcalorimeters with high energy-resolving power that simultaneously observe both calibrated x-ray standards and the x-ray emission lines under study. The uncertainty in absolute line energies is generally less than 0.4 eV in the energy range of 4.5 keV to 7.5 keV. Of the seventeen line energies of neodymium, samarium, and holmium, thirteen are found to be consistent with the available x-ray reference data measured after 1990; only two of the four lines for which reference data predate 1980, however, are consistent with our results. Five lines of terbium are measured with uncertainties that improve on those of existing data by factors of two or more. These results eliminate a significant discrepancy between measured and calculated x-ray line energies for the terbium Ll line (5.551 keV). The line widths are also measured, with uncertainties of 0.6 eV or less on the full-width at half-maximum in most cases. These measurements were made with an array of approximately one hundred superconducting x- ray microcalorimeters, each sensitive to an energy band from 1 keV to 8 keV. No energy-dispersive spectrometer has previously been used for absolute-energy estimation at this level of accuracy. Future spectrometers, with superior linearity and energy resolution, will allow us to improve on these results and expand the measurements to more elements and a wider range of line energies.
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We use an array of transition-edge sensors, cryogenic microcalorimeters with 4 eV energy resolution, to measure L x-ray emission-line profiles of four elements of the lanthanide series: praseodymium, neodymium, terbium, and holmium. The spectrometer also surveys numerous x-ray standards in order to establish an absolute-energy calibration traceable to the International System of Units for the energy range 4 keV to 10 keV. The new results include emission line profiles for 97 lines, each expressed as a sum of one or more Voigt functions; improved absolute energy uncertainty on 71 of these lines relative to existing reference data; a median uncertainty on the peak energy of 0.24 eV, four to ten times better than the median of prior work; and 6 lines that lack any measured values in existing reference tables. The 97 lines comprise nearly all of the most intense L lines from these elements under broad-band x-ray excitation. The work improves on previous measurements made with a similar cryogenic spectrometer by the use of sensors with better linearity in the absorbed energy and a gold x-ray absorbing layer that has a Gaussian energy-response function. It also employs a novel sample holder that enables rapid switching between science targets and calibration targets with excellent gain balancing. Most of the results for peak energy values shown here should be considered as replacements for the currently tabulated standard reference values, while the line shapes given here represent a significant expansion of the scope of available reference data.
This paper presents an absolute X-ray photon energy measurement method that uses a Bond diffractometer. The proposed system enables the prompt and rapid in-situ measurement of photon energies in a wide energy range. The diffractometer uses a reference silicon single crystal plate and a highly accurate angle encoder called SelfA. We evaluate the performance of the system by repeatedly measuring the energy of the first excited state of the potassium-40 nuclide. The excitation energy is determined as 29829.39(6) eV. It is one order of magnitude more precise than the previous measurement. The estimated uncertainty of the photon energy measurement was 0.7 ppm as a standard deviation and the maximum observed deviation was 2 ppm.
Quasi-simultaneous arrival (QSA) effects in secondary ion mass spectrometry can create mass-indepedent inaccuracies in isotope measurements when using electron multiplier detectors (EMs). The simple Poisson statistical model of QSA does not explain most experimental data. We present pulse-height distributions (PHDs) and time-series measurements to better study QSA. Our data show that PHDs and the distribution of multiple arrivals on the EM are not consistent with the Poisson model. Multiple arrivals are over-dispersed compared to Poisson and are closer to a negative binomial distribution. Through an emission-transmission-detection model we show that the QSA correction depends on the non-Poisson emission of multiple secondary ions, the secondary ion energy distribution, and other factors, making an analytical correction impractical. A standards-based correction for QSA is the best approach, and we show the proper way to calculate standards-normalized $delta$ values to minimize the effect of QSA.
A performance evaluation of superconducting transition-edge sensors (TESs) in the environment of a pion beam line at a particle accelerator is presented. Averaged across the 209 functioning sensors in the array, the achieved energy resolution is 5.2 eV FWHM at Co $K_{alpha}$ (6.9 keV) when the pion beam is off and 7.3 eV at a beam rate of 1.45 MHz. Absolute energy uncertainty of $pm$0.04 eV is demonstrated for Fe $K_{alpha}$ (6.4 keV) with in-situ energy calibration obtained from other nearby known x-ray lines. To achieve this small uncertainty, it is essential to consider the non-Gaussian energy response of the TESs and thermal cross-talk pile-up effects due to charged-particle hits in the silicon substrate of the TES array.
Nanoelectromechanical Systems (NEMS) are among the best candidates to measure interactions at nanoscale [1-6], especially when resonating oscillators are used with high quality factor [7, 8]. Despite many efforts [9, 10], efficient and easy actuation in NEMS remains an issue [11]. The mechanism that we propose, thermally mediated Center Of Mass (COM) displacements, represents a new actuation scheme for NEMS and MEMS. To demonstrate this scheme efficiency we show how mechanical nanodis- placements of a MEMS is triggered using modulated X-ray microbeams. The MEMS is a microswing constituted by a Ge microcrystal attached to a Si microcantilever. The interaction is mediated by the Ge absorption of the intensity modulated X-ray microbeam impinging on the microcrystal. The small but finite thermal expansion of the Ge microcrystal is large enough to force a nanodisplacement of the Ge microcrystal COM glued on a Si microlever. The inverse mechanism can be envisaged: MEMS can be used to shape X-ray beams. A Si microlever can be a high frequency X-ray beam chopper for time studies in biology and chemistry.
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