Do you want to publish a course? Click here

A Reassessment of the Quasi-Simultaneous Arrival Effect in Secondary Ion Mass Spectrometry

48   0   0.0 ( 0 )
 Added by Ryan Ogliore
 Publication date 2021
  fields Physics
and research's language is English




Ask ChatGPT about the research

Quasi-simultaneous arrival (QSA) effects in secondary ion mass spectrometry can create mass-indepedent inaccuracies in isotope measurements when using electron multiplier detectors (EMs). The simple Poisson statistical model of QSA does not explain most experimental data. We present pulse-height distributions (PHDs) and time-series measurements to better study QSA. Our data show that PHDs and the distribution of multiple arrivals on the EM are not consistent with the Poisson model. Multiple arrivals are over-dispersed compared to Poisson and are closer to a negative binomial distribution. Through an emission-transmission-detection model we show that the QSA correction depends on the non-Poisson emission of multiple secondary ions, the secondary ion energy distribution, and other factors, making an analytical correction impractical. A standards-based correction for QSA is the best approach, and we show the proper way to calculate standards-normalized $delta$ values to minimize the effect of QSA.



rate research

Read More

106 - A. Dobi , C. Hall , S. Slutsky 2011
We describe purity measurements of the natural and enriched xenon stockpiles used by the EXO-200 double beta decay experiment based on a mass spectrometry technique. The sensitivity of the spectrometer is enhanced by several orders of magnitude by the presence of a liquid nitrogen cold trap, and many impurity species of interest can be detected at the level of one part-per-billion or better. We have used the technique to screen the EXO-200 xenon before, during, and after its use in our detector, and these measurements have proven useful. This is the first application of the cold trap mass spectrometry technique to an operating physics experiment.
70 - J. Dobson , C. Ghag , L. Manenti 2017
Inductively Coupled Plasma Mass Spectrometry (ICP-MS) allows for rapid, high-sensitivity determination of trace impurities, notably the primordial radioisotopes $^{238}$U and $^{232}$Th, in candidate materials for low-background rare-event search experiments. We describe the setup and characterisation of a dedicated low-background screening facility at University College London where we operate an Agilent 7900 ICP-MS. The impact of reagent and carrier gas purity is evaluated and we show that twice-distilled ROMIL-SpA-grade nitric acid and zero-grade Ar gas delivers similar sensitivity to ROMIL-UpA-grade acid and research grade gas. A straightforward procedure for sample digestion and analysis of materials with U/Th concentrations down to 10 ppt g/g is presented. This includes the use of $^{233}$U and $^{230}$Th spikes to correct for signal loss from a range of sources and verification of $^{238}$U and $^{232}$Th recovery through digestion and analysis of a certified reference material with a complex sample matrix. Finally, we demonstrate assays and present results from two sample preparation and assay methods: a high-sensitivity measurement of ultra-pure Ti using open digestion techniques, and a closed vessel microwave digestion of a nickel-chromium-alloy using a multi-acid mixture.
We introduce a new technique for determining x-ray fluorescence line energies and widths, and we present measurements made with this technique of 22 x-ray L lines from lanthanide-series elements. The technique uses arrays of transition-edge sensors, microcalorimeters with high energy-resolving power that simultaneously observe both calibrated x-ray standards and the x-ray emission lines under study. The uncertainty in absolute line energies is generally less than 0.4 eV in the energy range of 4.5 keV to 7.5 keV. Of the seventeen line energies of neodymium, samarium, and holmium, thirteen are found to be consistent with the available x-ray reference data measured after 1990; only two of the four lines for which reference data predate 1980, however, are consistent with our results. Five lines of terbium are measured with uncertainties that improve on those of existing data by factors of two or more. These results eliminate a significant discrepancy between measured and calculated x-ray line energies for the terbium Ll line (5.551 keV). The line widths are also measured, with uncertainties of 0.6 eV or less on the full-width at half-maximum in most cases. These measurements were made with an array of approximately one hundred superconducting x- ray microcalorimeters, each sensitive to an energy band from 1 keV to 8 keV. No energy-dispersive spectrometer has previously been used for absolute-energy estimation at this level of accuracy. Future spectrometers, with superior linearity and energy resolution, will allow us to improve on these results and expand the measurements to more elements and a wider range of line energies.
56 - Xu Xu , Chengge Jiao , Kexue Li 2021
High-spatial-resolution secondary ion mass spectrometry offers a method for mapping lithium at nanoscale lateral resolution. Practical implementation of this technique offers significant potential for revealing the distribution of Li in many materials with exceptional lateral resolution and elemental sensitivity. Here, two state-of-the-art methods are demonstrated on an aluminium-lithium alloy to visualise nanoscale Li-rich phases by mapping the 7Li+ secondary ion. NanoSIMS 50L analysis with a radio frequency O- plasma ion source enabled visualisation of needle-shaped T1 (Al2CuLi) phases as small as 75 nm in width. A compact time-of-flight secondary ion mass spectrometry detector added to a focused ion beam scanning electron microscope facilitated mapping of the T1 phases down to 45 nm in width using a Ga+ ion beam. Correlation with high resolution electron microscopy confirms the identification of T1 precipitates, their sizes and distribution observed during SIMS mapping.
193 - G. Eitel , M. Block , A. Czasch 2009
A commercial, position-sensitive ion detector was used for the first time for the time-of-flight ion-cyclotron resonance detection technique in Penning trap mass spectrometry. In this work, the characteristics of the detector and its implementation in a Penning trap mass spectrometer will be presented. In addition, simulations and experimental studies concerning the observation of ions ejected from a Penning trap are described. This will allow for a precise monitoring of the state of ion motion in the trap.
comments
Fetching comments Fetching comments
Sign in to be able to follow your search criteria
mircosoft-partner

هل ترغب بارسال اشعارات عن اخر التحديثات في شمرا-اكاديميا