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Register a new userEffects of Strain and Buffer Layer on Interfacial Magnetization in Sr$_2$CrReO$_6$ Films Determined by Polarized Neutron Reflectometry
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We have determined the depth-resolved magnetization structures of a series of highly ordered Sr$_{2}$CrReO$_{6}$ (SCRO) ferrimagnetic epitaxial films via combined studies of x-ray reflectometry, polarized neutron reflectometry and SQUID magnetometry. The SCRO films deposited directly on (LaAlO$_3$)$_{0.3}$(Sr$_2$AlTaO$_6$)$_{0.7}$ or SrTiO$_{3}$ substrates show reduced magnetization of similar width near the interfaces with the substrates, despite having different degrees of strain. When the SCRO film is deposited on a Sr$_{2}$CrNbO$_{6}$ (SCNO) double perovskite buffer layer, the width the interfacial region with reduced magnetization is reduced, agreeing with an improved Cr/Re ordering. However, the relative reduction of the magnetization averaged over the interfacial regions are comparable among the three samples. Interestingly, we found that the magnetization suppression region is wider than the Cr/Re antisite disorder region at the interface between SCRO and SCNO.
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We report a synthesis route to grow iron nitride thin films with giant saturation magnetization (Ms) through an N inter-diffusion process. By post annealing Fe/Fe-N structured films grown on GaAs(001) substrates, nitrogen diffuses from the over-doped amorphous-like Fe-N layer into strained crystalline Fe layer and facilitates the development of metastable Fe16N2 phase. As explored by polarized neutron reflectometry, the depth-dependent Ms profile can be well described by a model with the presence of a giant Ms up to 2360 emu/cm3 at near-substrate interface, corresponding to the strained regions of these annealed films. This is much larger than the currently known limit (Fe65Co35 with Ms sim 1900 emu/cm3). The present synthesis method can be used to develop writer materials for future magnetic recording application.
We have used complementary neutron and x-ray reflectivity techniques to examine the depth profiles of a series of as-grown and annealed Ga[1-x]Mn[x]As thin films. A magnetization gradient is observed for two as-grown films and originates from a nonuniformity of Mn at interstitial sites, and not from local variations in Mn at Ga sites. Furthermore, we see that the depth-dependent magnetization can vary drastically among as-grown Ga[1-x]Mn[x]As films despite being deposited under seemingly similar conditions. These results imply that the depth profile of interstitial Mn is dependent not only on annealing, but is also extremely sensitive to initial growth conditions. We observe that annealing improves the magnetization by producing a surface layer that is rich in Mn and O, indicating that the interstitial Mn migrates to the surface. Finally, we expand upon our previous neutron reflectivity study of Ga[1-x]Mn[x]As, by showing how the depth profile of the chemical composition at the surface and through the film thickness is directly responsible for the complex magnetization profiles observed in both as-grown and annealed films.
Anti-site disorder is one of the most important issues that arises in synthesis of double perovskite for spintronic applications. Although it is known that anti-site disorder leads to a proliferation of structural defects, known as the anti-phase boundaries that separate ordered anti-phase domains in the sample, little is known about the magnetic correlation across these anti-phase boundaries on a microscopic level. Motivated by this, we report resonant elastic X-ray scattering study of room temperature magnetic and structural correlation in a thin-film sample of Sr$_2$CrReO$_6$, which has one of the highest $mathrm{T_C}$ among double perovskites. Structurally, we discovered existence of anti-phase nanodomains of $sim$15~nm in the sample. Magnetically, the ordered moments are shown to lie perpendicular to the $c$ direction. Most remarkably, we found that the magnetic correlation length far exceeds the size of individual anti-phase nanodomains. Our results therefore provide conclusive proof for existence of robust magnetic correlation across the anti-phase boundaries in Sr$_2$CrReO$_6$.
The magnetization-density distribution in the metallic ferromagnet SrRuO$_3$ was studied by means of polarized neutron diffraction. The analyzes by multipole refinements and by the maximum entropy method consistently reveal a strong polarization of all oxygen sites carrying 30% of the total magnetization. The spin-density distribution on the Ru site exhibits a nearly cubic shape in agreement with an almost equal occupation of $t_{2g}$ orbitals and $pd$ hybridization. The experimental analysis is well reproduced by density functional calculations. There is no qualitative change in the magnetization distribution between 2 and 200 K.
Neutron reflectometry is a powerful tool used for studies of surfaces and interfaces. In general the absorption in the typical studied materials can be neglected and this technique is limited to the measurement of the reflectivity only. In the case of strongly absorbing nuclei the number of neutrons is not conserved and the absorption can be directly measured by using the neutron-induced fluorescence technique which exploits the prompt particle emission of absorbing isotopes. This technique is emerging from soft matter and biology where highly absorbing nuclei, generally in very small quantities, are used as a label for buried layers. Nowadays the importance of highly absorbing layers is rapidly increasing, partially because of their application in neutron detection; a field that has become more and more active also due to the 3He-shortage. In this manuscript we extend the neutron-induced fluorescence technique to the study of thick layers of highly absorbing materials; in particular 10B4C. The theory of neutron reflectometry is a commonly studied topic, however the subtle relationship between the reflection and the absorption of neutrons is not widely known, in particular when a strong absorption is present. The theory for a general stack of absorbing layers has been developed and compared to measurements. This new technique has potential as a tool for characterization of highly absorbing layers. We also report on the requirements that a 10B4C layer must fulfill in order to be employed as a converter in neutron detection.
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