Do you want to publish a course? Click here

Tritium and helium analyses in thin films by enhanced proton backscattering

97   0   0.0 ( 0 )
 Added by Zhu An
 Publication date 2013
  fields
and research's language is English




Ask ChatGPT about the research

In order to perform quantitative tritium and helium analysis in thin film sample by using enhanced proton backscattering (EPBS), EPBS spectra for several samples consisting of non-RBS light elements (i.e., T, 4He, 12C, 16O, natSi), medium and heavy elements have been measured and analyzed by using analytical SIMNRA and Monte Carlo-based CORTEO codes. The CORTEO code used in this paper is modified and some non-RBS cross sections of proton scattering from T, 4He, 12C, 14N, 16O and natSi elements taken from ENDF/B-VII.1 database and the calculations of SigmaCalc code are incorporated. All cross section data needed in CORTEO code over the entire proton incident energy-scattering angle plane are obtained by interpolation. It is quantitatively observed that the multiple and plural scattering effects have little impact on energy spectra for light elements like T, He, C, O and Si, and the RBS cross sections of light elements, instead of the non-RBS cross sections, can be used in SIMNRA code for dual scattering calculations for EPBS analysis. It is also observed that at the low energy part of energy spectrum the results given by CORTEO code are higher than the results of SIMNRA code and are in better agreement with the experimental data, especially when heavier elements exist in samples. For tritium analysis, the tritium depth distributions should not be simply adjusted to fit the experimental spectra when the multiple and plural scattering contributions are not completely accounted, or else inaccurate results may be obtained. For medium and heavy matrix elements, when full Monte Carlo RBS calculations are used in CORTEO code, the results from CORTEO code are in good agreement with the experimental results at the low energy part of energy spectra, at this moment quantitative tritium and helium analysis in thin film sample by using enhanced proton backscattering can be performed reliably.



rate research

Read More

106 - S. Leray , A. Boudard , J. Cugnon 2009
Reliable predictions of light charged particle production in spallation reactions are important to correctly assess gas production in spallation targets. In particular, the helium production yield is important for assessing damage in the window separating the accelerator vacuum from a spallation target, and tritium is a major contributor to the target radioactivity. Up to now, the models available in the MCNPX transport code, including the widely used default option Bertini-Dresner and the INCL4.2-ABLA combination of models, were not able to correctly predict light charged particle yields. The work done recently on both the intranuclear cascade model INCL4, in which cluster emission through a coalescence process has been introduced, and on the de-excitation model ABLA allows correcting these deficiencies. This paper shows that the coalescence emission plays an important role in the tritium and $^3He$ production and that the combination of the newly develop
Helium implantation in epitaxial thin films is a way to control the out-of-plane deformation independently from the in-plane strain controlled by epitaxy. In particular, implantation by means of a helium microscope allows for local implantation and patterning down to the nanometer resolution, which is of interest for device applications. We present here a study of bismuth ferrite (BiFeO3) films where strain was patterned locally by helium implantation. Our combined Raman, XRD and TEM study shows that the implantation causes an elongation of the BiFeO3 unit cell and ultimately a transition towards the so-called super-tetragonal polymorph via states with mixed phases. In addition, TEM reveals the onset of amorphization at a threshold dose that does not seem to impede the overall increase in tetragonality. The phase transition from the R-like to T-like BiFeO3 appears as first-order in character, with regions of phase coexistence and abrupt changes in lattice parameters.
139 - H.Byeon , K. Nasyedkin , J.R. Lane 2018
We report on the observation of an anomalously high attenuation of high frequency surface acoustic waves by thin films of liquid $^{4}$He. The piezoelectric acoustic waves propagate along the surface of a lithium niobate substrate, which is coated with varying amounts of liquid helium. When the thickness of the helium layer is much larger than the wavelength of the surface acoustic wave on the substrate its attenuation is dominated by the excitation of compressional waves into the liquid, in good agreement with theory and previous measurements. However, for sufficiently thin helium coverage, we find that the acoustic wave attenuation is significantly increased beyond that measured with the substrate submerged in bulk liquid. Possible mechanisms for this enhanced attenuation are discussed.
In 1993 the Nijmegen group published the results of energy-dependent partial-wave analyses (PWAs) of the nucleon-nucleon (NN) scattering data for laboratory kinetic energies below Tlab=350 MeV (PWA93). In this talk some general aspects, but also the newest developments on the Nijmegen NN PWAs are reported. We have almost finished a new energy-dependent PWA and will discuss some typical aspects of this new PWA; where it differs from PWA93, but also what future developments might be, or should be.
The beta asymmetry in neutron beta decay is used to determine the ratio of axial-vector coupling to vector coupling most precisely. In electron spectroscopy, backscattering of electrons from detectors can be a major source of systematic error. We present the determination of the correction for undetected backscattering for electron detection with the instrument PERKEO III. For the electron asymmetry, undetected backscattering leads to a fractional correction of $5times 10^{-4}$, i.e. a change by 40% of the total systematic uncertainty.
comments
Fetching comments Fetching comments
Sign in to be able to follow your search criteria
mircosoft-partner

هل ترغب بارسال اشعارات عن اخر التحديثات في شمرا-اكاديميا