CdTe Thin films were deposited on glass substrates by thermal evaporation
method. The geometric thickness was calculated using interferometric method
based on reflectance curve recorded with the spectrophotometer. The XRD
analysis and optical char
acterizations of CdTe films with different optical
thicknesses reveals that the structure of the films is polycrystalline with
preferential orientation (111). The structure constant (a), crystallite size (D),
dislocation density (δ) and strain (ε) were calculated, and it is observed that the
crystallite size increases but micro-strain and dislocation density decreases with
increases in thin film thickness. The overall absorbance has been increased with
the film thickness and the direct band gap was obtained. It decreases with the
increase in the thickness of the films.
