The retroreflection phenomenon takes place in all optical and optoelectronical
devices and systems that use optical detectors, mirrors, CCD
cameras, filters, or glasses in the focal point and in the optical measurement
instruments, in general, pro
vided that some of their optical components are
retroreflective to light even for small apertures.
The article studies a precise method to measure the retroreflection index of
optical, opto-electronical systems, and treats the optical retroreflections which
are used in applied research of light with various lasers such as: Nd:YAG first
and second harmonics, He-Ne, and laser diodes.
We have studies the conformity of our results to the theory of
retroreflectors. We found that the retroreflection coefficient depends on laser
wavelength. The article points out that at 532nm laser wavelength the
retroreflection is greater than at 1064nm laser wavelength.
The results of this paper can be used in applied research, and led to
description of a mathematical relationship between the retroreflection index
and laser wavelength.
