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This paper presents low power dissipation, low phase noise ring oscillators (ROs) based on Semiconductor Manufacturing International Corporation (SMIC) 0.18{mu}m CMOS technology at liquid helium temperature (LHT). First, the characterization and modelling of CMOS at LHT are presented. The temperature-dependent device parameters are revised and the model then shows good agreement with the measurement results. The ring oscillator is then designed with energy efficiency optimization by application of forward body biasing (FBB). FBB is proposed to compensate for the threshold voltage (VTH) shift to preserve the benefits of the enhancement of the carrier mobility at 4.2K. The delay per stage ({tau}p), the static current (ISTAT), the dynamic current (IDYN), the power dissipation (P) and the phase noise (L(foff)) are analyzed at both 298 K and 4.2 K, with and without FBB. The performance of the designed RO in terms of speed ({tau}p=179ps), static current (23.55nA/stage), power dissipation (2.13{mu}W) and phase noise (-177.57dBc/Hz@1MHz) can be achieved at 4.2K with the supply voltage (VDD) reduced to 0.9V.
Previous cryogenic electronics studies are most above 4.2K. In this paper we present the cryogenic characterization of a 0.18{mu}m standard bulk CMOS technology(1.8V and 5V) at sub-kelvin temperature around 270mK. PMOS and NMOS devices with different
Cryogenic characterization and modeling of 0.18um CMOS technology (1.8V and 5V) are presented in this paper. Several PMOS and NMOS transistors with different width to length ratios(W/L) were extensively characterized under various bias conditions at
This work presents a self-heating study of a 40-nm bulk-CMOS technology in the ambient temperature range from 300 K down to 4.2 K. A custom test chip was designed and fabricated for measuring both the temperature rise in the MOSFET channel and in the
X-ray polarimetry in astronomy has not been exploited well, despite its importance. The recent innovation of instruments is changing this situation. We focus on a complementary MOS (CMOS) pixel detector with small pixel size and employ it as an x-ray
The Helium Ion Microscope (HIM) has the capability to image small features with a resolution down to 0.35 nm due to its highly focused gas field ionization source and its small beam-sample interaction volume. In this work, the focused helium ion beam