ﻻ يوجد ملخص باللغة العربية
High mobility two-dimensional electron gases (2DEGs) underpin todays silicon based devices and are of fundamental importance for the emerging field of oxide electronics. Such 2DEGs are usually created by engineering band offsets and charge transfer at heterointerfaces. However, in 2011 it was shown that highly itinerant 2DEGs can also be induced at bare surfaces of different transition metal oxides where they are far more accessible to high resolution angle resolved photoemission (ARPES) experiments. Here we review work from this nascent field which has led to a systematic understanding of the subband structure arising from quantum confinement of highly anisotropic transition metal d-states along different crystallographic directions. We further discuss the role of different surface preparations and the origin of surface 2DEGs, the understanding of which has permitted control over 2DEG carrier densities. Finally, we discuss signatures of strong many-body interactions and how spectroscopic data from surface 2DEGs may be related to the transport properties of interface 2DEGs in the same host materials.
We report on the transport characterization in dark and under light irradiation of three different interfaces: LaAlO3/SrTiO3, LaGaO3/SrTiO3, and the novel NdGaO3/SrTiO3 heterostructure. All of them share a perovskite structure, an insulating nature o
The discovery of two-dimensional electron gases (2DEGs) at the interface between two insulating complex oxides, such as LaAlO3 (LAO) or gamma-Al2O3 (GAO) epitaxially grown on SrTiO3 (STO) 1,2, provides an opportunity for developing all-oxide electron
We have performed systematic tight-binding (TB) analyses of the angle-resolved photoemission spectroscopy (ARPES) spectra of transition-metal (TM) oxides A$M$O$_3$ ($M=$ Ti, V, Mn, and Fe) with the perovskite-type structure and compared the obtained
Electron gases at the surfaces of (001), (110), and (111) oriented SrTiO3 (STO) have been created using Ar+-irradiation with fully metallic behavior and low-temperature-mobility as large as 5500 cm2V-1s-1, 1300 cm2V-1s-1 and 8600 cm2V-1s-1 for (001)-
The pressure-induced insulator to metal transition (IMT) of layered magnetic nickel phosphorous tri-sulfide NiPS3 was studied in-situ under quasi-uniaxial conditions by means of electrical resistance (R) and X-ray diffraction (XRD) measurements. This