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Entropy plays a key role in statistical physics of complex systems, which in general exhibit diverse aspects of emergence on different scales. However, it still remains not fully resolved how entropy varies with the coarse-graining level and the description scale. In this paper, we consider a Yule-type growth model, where each element is characterized by its size being either continuous or discrete. Entropy is then defined directly from the probability distribution of the states of all elements as well as from the size distribution of the system. Probing in detail their relations and time evolutions, we find that heterogeneity in addition to correlations between elements could induce loss of information during the coarse-graining procedure. It is also revealed that the expansion of the size space domain depends on the description level, leading to a difference between the continuous description and the discrete one.
We numerically study quenches from a fully ordered state to the ferromagnetic regime of the chiral $mathbb{Z}_3$ clock model, where the physics can be understood in terms of sparse domain walls of six flavors. As in the previously studied models, the
We study, both analytically and numerically, the interaction effects on the skewness of the size distribution of elements in a growth model. We incorporate two types of global interaction into the growth model, and develop analytic expressions for th
Using a recently developed thermodynamic integration method, we compute the precise values of the excess Gibbs free energy (G^e) of the high density liquid (HDL) phase with respect to the crystalline phase at different temperatures (T) in the superco
The effect of geometry in the statistics of textit{nonlinear} universality classes for interface growth has been widely investigated in recent years and it is well known to yield a split of them into subclasses. In this work, we investigate this for
Stochastic models of surface growth are usually based on randomly choosing a substrate site to perform iterative steps, as in the etching model [1]. In this paper I modify the etching model to perform sequential, instead of random, substrate scan. Th