اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدDesign of Dual-Polarization Horn-Coupled Kinetic Inductance Detectors for Cosmic Microwave Background Polarimetry
113
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
Mapping the polarization of the Cosmic Microwave Background is yielding exciting data on the origin of the universe, the reionization of the universe, and the growth of cosmic structure. Kilopixel arrays represent the current state of the art, but advances in detector technology are needed to enable the larger detector arrays needed for future measurements. Here we present a design for single-band dual-polarization Kinetic Inductance Detectors (KIDs) at 20% bandwidths centered at 145, 220, and 280 GHz. The detection and readout system is nearly identical to the successful photon-noise-limited aluminum Lumped-Element KIDs that have been recently built and tested by some of the authors. Fabricating large focal plane arrays of the feed horns and quarter-wave backshorts requires only conventional precision machining. Since the detectors and readout lines consist only of a single patterned aluminum layer on a SOI wafer, arrays of the detectors can be built commercially or at a standard university cleanroom.
قيم البحث
اقرأ أيضاً
Lumped-element kinetic inductance detectors (LEKIDs) are an attractive technology for millimeter-wave observations that require large arrays of extremely low-noise detectors. We designed, fabricated and characterized 64-element (128 LEKID) arrays of
horn-coupled, dual-polarization LEKIDs optimized for ground-based CMB polarimetry. Our devices are sensitive to two orthogonal polarizations in a single spectral band centered on 150 GHz with $Delta u/ u=0.2$. The $65times 65$ mm square arrays are designed to be tiled into the focal plane of an optical system. We demonstrate the viability of these dual-polarization LEKIDs with laboratory measurements. The LEKID modules are tested with an FPGA-based readout system in a sub-kelvin cryostat that uses a two-stage adiabatic demagnetization refrigerator. The devices are characterized using a blackbody and a millimeter-wave source. The polarization properties are measured with a cryogenic stepped half-wave plate. We measure the resonator parameters and the detector sensitivity, noise spectrum, dynamic range, and polarization response. The resonators have internal quality factors approaching $1times 10^{6}$. The detectors have uniform response between orthogonal polarizations and a large dynamic range. The detectors are photon-noise limited above 1 pW of absorbed power. The noise-equivalent temperatures under a 3.4 K blackbody load are $<100~mumathrm{Ksqrt{s}}$. The polarization fractions of detectors sensitive to orthogonal polarizations are >80%. The entire array is multiplexed on a single readout line, demonstrating a multiplexing factor of 128. The array and readout meet the requirements for 4 arrays to be read out simultaneously for a multiplexing factor of 512. This laboratory study demonstrates the first dual-polarization LEKID array optimized for CMB polarimetry and shows the readiness of the detectors for on-sky observations.
The next generation BLAST experiment (BLAST-TNG) is a suborbital balloon payload that seeks to map polarized dust emission in the 250 $mu$m, 350 $mu$m and 500 $mu$m wavebands. The instrument utilizes a stepped half-wave plate to reduce systematics. T
he general requirement of the detectors is that they are photon-noise-limited and dual-polarization sensitive. To achieve this goal, we are developing three monolithic arrays of cryogenic sensors, one for each waveband. Each array is feedhorn-coupled and each spatial pixel consists of two orthogonally spaced polarization-sensitive microwave kinetic inductance detectors (MKIDs) fabricated from a Ti/TiN multilayer film. In previous work, we demonstrated photon-noise-limited sensitivity in 250 $mu$m waveband single polarization devices. In this work, we present the first results of dual-polarization sensitive MKIDs at 250 $mu$m.
Microwave Kinetic Inductance Detectors (MKIDs) have great potential for large very sensitive detector arrays for use in, for example, sub-mm imaging. Being intrinsically readout in the frequency domain, they are particularly suited for frequency doma
in multiplexing allowing $sim$1000s of devices to be readout with one pair of coaxial cables. However, this moves the complexity of the detector from the cryogenics to the warm electronics. We present here the concept and experimental demonstration of the use of Fast Fourier Transform Spectrometer (FFTS) readout, showing no deterioration of the noise performance compared to low noise analog mixing while allowing high multiplexing ratios.
Microwave Kinetic Inductance Detectors (MKIDs) have shown great potential for sub-mm instrumentation because of the high scalability of the technology. Here we demonstrate for the first time in the sub-mm band (0.1...2 mm) a photon noise limited perf
ormance of a small antenna coupled MKID detector array and we describe the relation between photon noise and MKID intrinsic generation-recombination noise. Additionally we use the observed photon noise to measure the optical efficiency of detectors to be 0.8+-0.2.
Large ultra-sensitive detector arrays are needed for present and future observatories for far infra-red, submillimeter wave (THz), and millimeter wave astronomy. With increasing array size, it is increasingly important to control stray radiation insi
de the detector chips themselves, the surface wave. We demonstrate this effect with focal plane arrays of 880 lens-antenna coupled Microwave Kinetic Inductance Detectors (MKIDs). Presented here are near field measurements of the MKID optical response versus the position on the array of a reimaged optical source. We demonstrate that the optical response of a detector in these arrays saturates off-pixel at the $sim-30$ dB level compared to the peak pixel response. The result is that the power detected from a point source at the pixel position is almost identical to the stray response integrated over the chip area. With such a contribution, it would be impossible to measure extended sources, while the point source sensitivity is degraded due to an increase of the stray loading. However, we show that by incorporating an on-chip stray light absorber, the surface wave contribution is reduced by a factor $>$10. With the on-chip stray light absorber the point source response is close to simulations down to the $sim-35$ dB level, the simulation based on an ideal Gaussian illumination of the optics. In addition, as a crosscheck we show that the extended source response of a single pixel in the array with the absorbing grid is in agreement with the integral of the point source measurements.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
