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High Precision Ionization Chamber for Relative Intensity Monitoring of Synchrotron Radiation

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 نشر من قبل Syed Naeem Ahmed
 تاريخ النشر 1999
  مجال البحث فيزياء
والبحث باللغة English
 تأليف S.N. Ahmed




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A single channel, high precision ionization chamber has been built for monitoring the relative intensity of X-rays in the energy range above 5 keV. It can be used in experiments, such as EXAFS, where simultaneous high precision monitoring of the relative intensity during the actual experiment is required. In this paper the construction of the chamber and its performance during test measurements with an X-ray tube are presented.



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