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Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width

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 نشر من قبل Apu Sarkar
 تاريخ النشر 2007
  مجال البحث فيزياء
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The anisotropic broadening of ZrSiO4 sample is modelled using the Stephenss phenomenological model for anisotropic line broadening and the three dimensional strain distribution in the sample is plotted. The micro-structural parameters like domain size and dislocation density are estimated using the variance method.



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