اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدSENSEI: Characterization of Single-Electron Events Using a Skipper-CCD
89
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
We use a science-grade Skipper Charge Coupled Device (Skipper-CCD) operating in a low-radiation background environment to develop a semi-empirical model that characterizes the origin of single-electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as ``dark counts: dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89+-0.77)x10^-4 e-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52+-0.07)x10^-4 e-/pix, which is exposure-independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detectors operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing R&D efforts of Skipper and conventional CCDs.
قيم البحث
اقرأ أيضاً
We have developed a non-destructive readout system that uses a floating-gate amplifier on a thick, fully depleted charge coupled device (CCD) to achieve ultra-low readout noise of 0.068 e- rms/pix. This is the first time that discrete sub-electron re
adout noise has been achieved reproducibly over millions of pixels on a stable, large-area detector. This allows the precise counting of the number of electrons in each pixel, ranging from pixels with 0 electrons to more than 1500 electrons. The resulting CCD detector is thus an ultra-sensitive calorimeter. It is also capable of counting single photons in the optical and near-infrared regime. Implementing this innovative non-destructive readout system has a negligible impact on CCD design and fabrication, and there are nearly immediate scientific applications. As a particle detector, this CCD will have unprecedented sensitivity to low-mass dark matter particles and coherent neutrino-nucleus scattering, while astronomical applications include future direct imaging and spectroscopy of exoplanets.
With Skipper-CCD detectors it is possible to take multiple samples of the charge packet collected on each pixel. After averaging the samples, the noise can be extremely reduced allowing the exact counting of electrons per pixel. In this work we prese
nt an analog circuit that, with a minimum number of components, applies a double slope integration (DSI), and at the same time, it averages the multiple samples producing at its output the pixel value with sub-electron noise. For this prupose, we introduce the technique of using the DSI integrator capacitor to add the skipper samples. An experimental verification using discrete components is presented, together with an analysis of its noise sources and limitations. After averaging 400 samples it was possible reach a readout noise of 0.2,$e^-_{RMS}/pix$, comparable to other available readout systems. Due to its simplicity and significant reduction of the sampling requirements, this circuit technique is of particular interest in particle experiments and cameras with a high density of Skipper-CCDs.
We present new direct-detection constraints on eV-to-GeV dark matter interacting with electrons using a prototype detector of the Sub-Electron-Noise Skipper-CCD Experimental Instrument. The results are based on data taken in the MINOS cavern at the F
ermi National Accelerator Laboratory. We focus on data obtained with two distinct readout strategies. For the first strategy, we read out the Skipper-CCD continuously, accumulating an exposure of 0.177 gram-days. While we observe no events containing three or more electrons, we find a large one- and two-electron background event rate, which we attribute to spurious events induced by the amplifier in the Skipper-CCD readout stage. For the second strategy, we take five sets of data in which we switch off all amplifiers while exposing the Skipper-CCD for 120k seconds, and then read out the data through the best prototype amplifier. We find a one-electron event rate of (3.51 +- 0.10) x 10^(-3) events/pixel/day, which is almost two orders of magnitude lower than the one-electron event rate observed in the continuous-readout data, and a two-electron event rate of (3.18 +0.86 -0.55) x 10^(-5) events/pixel/day. We again observe no events containing three or more electrons, for an exposure of 0.069 gram-days. We use these data to derive world-leading constraints on dark matter-electron scattering for masses between 500 keV to 5 MeV, and on dark-photon dark matter being absorbed by electrons for a range of masses below 12.4 eV.
The skipper CCD is a special type of charge coupled device in which the readout noise can be reduced to sub-electron levels by averaging independent measurements of the same charge. Thus the charge in the pixels can be determined by counting the exac
t number of electrons. The total readout time is proportional to the number of measurements of the charge in each pixel. For some applications this time may be too long; however, researchers usually are interested only on certain region within the matrix of pixels. In this paper we present the development of a smart skipper readout technique that allows the user to specify regions of interest of the CCD matrix where an arbitrary (high) number of measurements of the same charge can taken to obtain the desired noise level, and far less measurements are performed in those regions that are less interesting to the researcher, therefore reducing the total readout time.
An important source of background in direct searches for low-mass dark matter particles are the energy deposits by small-angle scattering of environmental $gamma$ rays. We report detailed measurements of low-energy spectra from Compton scattering of
$gamma$ rays in the bulk silicon of a charge-coupled device (CCD). Electron recoils produced by $gamma$ rays from $^{57}$Co and $^{241}$Am radioactive sources are measured between 60 eV and 4 keV. The observed spectra agree qualitatively with theoretical predictions, and characteristic spectral features associated with the atomic structure of the silicon target are accurately measured for the first time. A theoretically-motivated parametrization of the data that describes the Compton spectrum at low energies for any incident $gamma$-ray flux is derived. The result is directly applicable to background estimations for low-mass dark matter direct-detection experiments based on silicon detectors, in particular for the DAMIC experiment down to its current energy threshold.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
