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Few-shot instance segmentation (FSIS) conjoins the few-shot learning paradigm with general instance segmentation, which provides a possible way of tackling instance segmentation in the lack of abundant labeled data for training. This paper presents a Fully Guided Network (FGN) for few-shot instance segmentation. FGN perceives FSIS as a guided model where a so-called support set is encoded and utilized to guide the predictions of a base instance segmentation network (i.e., Mask R-CNN), critical to which is the guidance mechanism. In this view, FGN introduces different guidance mechanisms into the various key components in Mask R-CNN, including Attention-Guided RPN, Relation-Guided Detector, and Attention-Guided FCN, in order to make full use of the guidance effect from the support set and adapt better to the inter-class generalization. Experiments on public datasets demonstrate that our proposed FGN can outperform the state-of-the-art methods.
State-of-the-art semantic segmentation methods require sufficient labeled data to achieve good results and hardly work on unseen classes without fine-tuning. Few-shot segmentation is thus proposed to tackle this problem by learning a model that quick
Few-shot segmentation has been attracting a lot of attention due to its effectiveness to segment unseen object classes with a few annotated samples. Most existing approaches use masked Global Average Pooling (GAP) to encode an annotated support image
Learning-based methods for visual segmentation have made progress on particular types of segmentation tasks, but are limited by the necessary supervision, the narrow definitions of fixed tasks, and the lack of control during inference for correcting
Few-shot segmentation targets to segment new classes with few annotated images provided. It is more challenging than traditional semantic segmentation tasks that segment known classes with abundant annotated images. In this paper, we propose a Protot
Deep learning has significantly improved the precision of instance segmentation with abundant labeled data. However, in many areas like medical and manufacturing, collecting sufficient data is extremely hard and labeling this data requires high profe