اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدIon and Electron Ghost Imaging
66
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
In this Letter, we report a demonstration of ion and electron ghost imaging. Two beams of correlated ions and electrons are produced by a photoionization process and accelerated into opposite directions. Using a single time and position sensitive detector for one beam, we can image an object seen by the other beam even when the detector that sees this object has no spatial resolution. The extra information given by this second detector can, therefore, be used to reconstruct the image thanks to the correlation between the ions and the electrons. In our example, a metallic mask placed in front of a time-sensitive detector is used as the object to image. We demonstrated ion and electron ghost imaging using this mask in a transmission mode. These primary results are very promising and open applications especially in ion and electron imaging in surface science and nanophysics.
قيم البحث
اقرأ أيضاً
Ghost imaging is a technique -- first realized in quantum optics -- in which the image emerges from cross-correlation between particles in two separate beams. One beam passes through the object to a bucket (single-pixel) detector, while the second be
ams spatial profile is measured by a high resolution (multi-pixel) detector but never interacts with the object. Neither detector can reconstruct the image independently. However, until now ghost imaging has only been demonstrated with photons. Here we report the first realisation of ghost imaging of an object using massive particles. In our experiment, the two beams are formed by correlated pairs of ultracold metastable helium atoms, originating from two colliding Bose-Einstein condensates (BECs) via $s$-wave scattering. We use the higher-order Kapitza-Dirac effect to generate the large number of correlated atom pairs required, enabling the creation of a ghost image with good visibility and sub-millimetre resolution. Future extensions could include ghost interference as well as tests of EPR entantlement and Bells inequalities.
We report on the design, commissioning, and initial measurements of a Transition-edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the N
IST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high x-ray collection efficiency and resolving power. NETS utilizes 192 individual TES x-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ~30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the x-ray energies from roughly 500 eV to 8,000 eV and achieve an energy resolution of 3.7 eV to 5.0 eV over this range, a more modest (<2X) improvement over the previous microcalorimeters. Beyond this energy range NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into x-ray spectra, a process that will be the basis for analyzing future data.
Radiation damage is one of the most severe resolution limiting factors in x-ray imaging, especially relevant to biological samples. One way of circumventing this problem is to exploit correlation-based methods developed in quantum imaging. Among thes
e, there is ghost imaging (GI) in which the image is formed by radiation that has never interacted with the sample. Here, we demonstrate GI at an XUV free-electron laser by utilizing correlation techniques. We discuss the experimental challenges, optimal setup, and crucial ingredients to maximize the achievable resolution.
The production of negative ions in cesium sputter ion sources is generally considered to be a pure surface process. It has been recently proposed that ion pair production could explain the higher-than-expected beam currents extracted from these ion s
ources, therefore opening the door for laser-assisted enhancement of the negative ion yield. We have tested this hypothesis by measuring the effect of various pulsed diode lasers on the O$^-$ beam current produced from Al$_2$O$_3$ cathode of a cesium sputter ion source. It is expected that the ion pair production of O$^-$ requires populating the 5d electronic states of neutral cesium, thus implying that the process should be provoked only with specific wavelengths. Our experimental results provide evidence for the existence of a wavelength-dependent photo-assisted effect but cast doubt on its alleged resonant nature as the prompt enhancement of beam current can be observed with laser wavelengths exceeding a threshold photon energy. The beam current transients observed during the laser pulses suggest that the magnitude and longevity of the beam current enhancement depends on the cesium balance on the cathode surface. We conclude that the photo-assisted negative ion production could be of practical importance as it can more than double the extracted beam current under certain operational settings of the ion source.
We present a simple diode laser-based photoionization scheme for generating electrons and ions with well-defined spatial and energetic (<2 eV) structures. This scheme can easily be implemented into ion or electron imaging spectrometers for the purpos
e of off-line characterization and calibration. The low laser power ~1$ mW needed from a passively stabilized diode laser and the low flux of potassium atoms in an effusive beam make our scheme a versatile source of ions and electrons for applications in research and education.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
