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The structural properties of Er-doped AlNO epilayers grown by radio frequency magnetron sputtering were studied by Extended X-ray Absorption Fine Structure (EXAFS) spectra recorded at the Er L 3 edge. The analysis revealed that Er substitutes for Al in all the studied samples and the increase in Er concentration from 0.5 to 3.6 at.% is not accompanied by formation of ErN, Er 2 O 3 or Er clusters. Simultaneously recorded X-ray Absorption Near Edge Structure (XANES) spectra verify that the bonding configuration of Er is similar in all studied samples. The Er-N distance is 2 constant at 2.18-2.19 {AA} i.e. approximately 15% larger than the Al-N bondlength, revealing that the introduction of Er in the cation sublattice causes considerable local distortion. The Debye-Waller factor, which measures the static disorder, of the second nearest shell of Al neighbors, has a local minimum for the sample containing 1% Er that coincides with the highest photoluminescence efficiency of the sample set.
We report the near-edge x-ray absorption fine structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of Highly Ordered Pyrolytic Graphite (HOPG) on a SiO2 substrate. We utilized a PhotoEmission Elect
Local structure of FeSe(1-x)Te(x) has been studied by extended x-ray absorption fine-structure (EXAFS) measurements as a function of temperature. Combination of Se and Fe K edge EXAFS has permitted to quantify the local interatomic distances and thei
We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100-500~AA) as a function of film thickness using polarization-dependent extended x-ray absorption fine structure (EXAFS). All films investig
We report new measurements and calculations of the non-resonant inelastic x-ray scattering (NRIXS) from Mg and Al for a wide range of momentum transfers, q. Extended oscillations in the dynamic structure factor S(q,w) due to scattering from the 2p an
Oscillatory structure is found in the atomic background absorption in x-ray-absorption fine structure (XAFS). This atomic-XAFS or AXAFS arises from scattering within an embedded atom, and is analogous to the Ramsauer-Townsend effect. Calculations and