We report an original method allowing to recover the temporal profile of any kind of soft X-ray laser pulse in single-shot operation. We irradiated a soft X-ray multilayer mirror with an intense infrared femtosecond laser pulse in a traveling wave geometry and took advantage of the sudden reflectivity drop of the mirror to reconstruct the temporal profile of the soft X-ray pulse. We inferred a pulse shape with a duration of a few ps in good agreement with numerical calculations and experimental work.
X-ray Absorption Spectroscopy (XAS) is a widely used X-ray diagnostic method. While synchrotrons have large communities of XAS users, its use on X-Ray Free Electron Lasers (XFEL) facilities has been rather limited. At a first glance, the relatively n
arrow bandwidth and the highly fluctuating spectral structure of XFEL sources seem to prevent high-quality XAS measurements without accumulating over many shots. Here, we demonstrate for the first time the collection of single-shot XAS spectra on an XFEL, with error bars of only a few percent, over tens of eV. We show how this technique can be extended over wider spectral ranges towards Extended X-ray Absorption Fine Structure (EXAFS) measurements, by concatenating a few tens of single-shot measurements. Such results open indisputable perspectives for future femtosecond time resolved XAS studies, especially for transient processes that can be initiated at low repetition rate.
In this paper, a division-of-amplitude photopolarimeter (DOAP) for measuring the polarization state of free-electron laser (FEL) pulse is described. The incident FEL beam is divided into four separate beams, and four Stokes parameters can be measured
in a single-shot. In the crossed-planar undulators experiment at Shanghai deep ultraviolet FEL test facility, this DOAP instrument constructed in house responses accurately and timely while the polarization-state of fully coherent FEL pulses are switched, which is helpful for confirming the crossed-planar undulators technique for short-wavelength FELs.
Resonant elastic X-ray scattering has been widely employed for exploring complex electronic ordering phenomena, like charge, spin, and orbital order, in particular in strongly correlated electronic systems. In addition, recent developments of pump-pr
obe X-ray scattering allow us to expand the investigation of the temporal dynamics of such orders. Here, we introduce a new time-resolved Resonant Soft X-ray Scattering (tr-RSXS) endstation developed at the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). This endstation has an optical laser (wavelength of 800 nm plus harmonics) as the pump source. Based on the commissioning results, the tr-RSXS at PAL-XFEL can deliver a soft X-ray probe (400-1300 eV) with a time resolution about ~100 fs without jitter correction. As an example, the temporal dynamics of a charge density wave on a high-temperature cuprate superconductor is demonstrated.
The fluctuations of the longitudinal coherence length expected from the worlds first hard X-ray Free Electron Laser, the Linac Coherent Light Source, are investigated. We analyze, on a shot-to-shot basis, series of power spectra generated from 1D-FEL
simulations. We evaluate how the intrinsic noise in the spectral profile of the X-ray beam reflects on its longitudinal coherence length. We show that the spectral stability of the LCLS beam will allow coherent X-ray experiments with a reasonable acquisition time. We also propose a scheme to deliver single-mode X-ray radiation using a narrow bandpass monochromator.
We have designed and tested an automated simple setup for quickly measuring the profile and spot size of a Gaussian laser beam using three cost-affordable light sensors. Two profiling techniques were implemented: imaging for the CMOS 2D array (webcam
) and scanning knife-edge-like using a single photodiode and an LDR. The methods and sensors were compared to determine their accuracy using lasers of two different wavelengths and technologies. We verify that it is possible to use a low-cost webcam to determine the profile of a laser with 1% uncertainty on the beam waist, 1.5% error on the waistline position, and less than 3% error in determining the minimum spot radius. The photodiode measurement is the most stable since it is not affected by the change in laser intensity. In addition, we show that it is possible to use an inexpensive LDR sensor to estimate the laser spot size with an 11% error.