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تسجيل مستخدم جديدA Note on Polynomial Identity Testing for Depth-3 Circuits
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نشر من قبل
Abhranil Chatterjee
تاريخ النشر
2018
مجال البحث
الهندسة المعلوماتية
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English
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Let $C$ be a depth-3 arithmetic circuit of size at most $s$, computing a polynomial $ f in mathbb{F}[x_1,ldots, x_n] $ (where $mathbb{F}$ = $mathbb{Q}$ or $mathbb{C}$) and the fan-in of the product gates of $C$ is bounded by $d$. We give a deterministic polynomial identity testing algorithm to check whether $fequiv 0$ or not in time $ 2^d text{ poly}(n,s) $.
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