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Two-dimensional (2D) materials and their heterostructures, with wafer-scale synthesis methods and fascinating properties, have attracted numerous interest and triggered revolutions of corresponding device applications. However, facile methods to realize accurate, intelligent and large-area characterizations of these 2D structures are still highly desired. Here, we report a successful application of machine-learning strategy in the optical identification of 2D structure. The machine-learning optical identification method (MOI method) endows optical microscopy with intelligent insight into the characteristic colour information in the optical photograph. Experimental results indicate that the MOI method enables accurate, intelligent and large-area characterizations of graphene, molybdenum disulphide (MoS2) and their heterostructures, including identifications of the thickness, the existence of impurities, and even the stacking order. Thanks to the convergence of artificial intelligence and nanoscience, this intelligent identification method can certainly promote the fundamental research and wafer-scale device application of 2D structures.
Indium selenide (InSe), as a novel van der Waals layered semiconductor, has attracted a large research interest thanks to its excellent optical and electrical properties in the ultra-thin limit. Here, we discuss four different optical methods to quan
Advanced microscopy and/or spectroscopy tools play indispensable role in nanoscience and nanotechnology research, as it provides rich information about the growth mechanism, chemical compositions, crystallography, and other important physical and che
Ferroelectricity and metallicity are usually believed not to coexist because conducting electrons would screen out static internal electric fields. In 1965, Anderson and Blount proposed the concept of ferroelectric metal, however, it is only until re
The large-scale search for high-performing candidate 2D materials is limited to calculating a few simple descriptors, usually with first-principles density functional theory calculations. In this work, we alleviate this issue by extending and general
Important recent advances in transmission electron microscopy instrumentation and capabilities have made it indispensable for atomic-scale materials characterization. At the same time, the availability of two-dimensional materials has provided ideal