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Reflectance confocal microscopy (RCM) is an effective, non-invasive pre-screening tool for skin cancer diagnosis, but it requires extensive training and experience to assess accurately. There are few quantitative tools available to standardize image acquisition and analysis, and the ones that are available are not interpretable. In this study, we use a recurrent neural network with attention on convolutional network features. We apply it to delineate skin strata in vertically-oriented stacks of transverse RCM image slices in an interpretable manner. We introduce a new attention mechanism called Toeplitz attention, which constrains the attention map to have a Toeplitz structure. Testing our model on an expert labeled dataset of 504 RCM stacks, we achieve 88.17% image-wise classification accuracy, which is the current state-of-art.
We describe a new multiresolution nested encoder-decoder convolutional network architecture and use it to annotate morphological patterns in reflectance confocal microscopy (RCM) images of human skin for aiding cancer diagnosis. Skin cancers are the
A reliable sense-and-avoid system is critical to enabling safe autonomous operation of unmanned aircraft. Existing sense-and-avoid methods often require specialized sensors that are too large or power intensive for use on small unmanned vehicles. Thi
This paper introduces new attention-based convolutional neural networks for selecting bands from hyperspectral images. The proposed approach re-uses convolutional activations at different depths, identifying the most informative regions of the spectr
In this paper, a deep neural network based ensemble method is experimented for automatic identification of skin disease from dermoscopic images. The developed algorithm is applied on the task3 of the ISIC 2018 challenge dataset (Skin Lesion Analysis Towards Melanoma Detection).
Microscopy images are powerful tools and widely used in the majority of research areas, such as biology, chemistry, physics and materials fields by various microscopies (scanning electron microscope (SEM), atomic force microscope (AFM) and the optica