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We report here a quantitative method of Transmission Electron Microscopy (TEM) to measure the shapes, sizes and volumes of nanoparticles which are responsible for their properties. Gold nanoparticles (Au NPs) acting as nucleating agents for the electroless deposition of silver NPs on SU-8 polymers were analyzed in this project. The atomic-number contrast (Z-contrast) imaging technique reveals the height and effective diameter of each Au NP and a volume distribution is obtained. Varying the reducing agents produced Au NPs of different sizes which were found both on the polymer surface and in some cases buried several nanometers below the surface. The morphology of Au NPs is an important factor for systems that use surface-bound nanoparticles as nucleation sites as in electroless metallization. Electrolessly deposited silver layers reduced by hydroquinone on SU-8 polymer are analyzed in this project.
A novel technique to deposit metals on highly conjugated polyaniline films has been developed. In general, electrodeposition of metals, having low reduction potential, from aqueous solution, is difficult due to disruptive effect of hydrogen which evo
The formation of a novel surface reconstruction upon Co deposition on freshly cleaved Ge(111)2x1 surfaces is studied by means of scanning tunneling microscopy (STM) at low temperature. The deposited Co atoms are immobile at substrate temperatures of
The surface properties of a substrate are among the most important parameters in the printing technology of functional materials, determining not only the printing resolution but also the stability of the printed features. This paper addresses the we
In tribology, it is of importance to properly characterize the topography of rough surfaces. In this work, the three-dimensional topographies of plain grinding surfaces are measured through a white light interferometer, and their geometrical statisti
This work studies the effect of four different types of buffer layers on the structural and optical properties of InGaN layers grown on Si(111) substrates and their correlation with electrical characteristics. The vertical electrical conduction of n-