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Electric-field noise from the surfaces of ion-trap electrodes couples to the ions charge causing heating of the ions motional modes. This heating limits the fidelity of quantum gates implemented in quantum information processing experiments. The exact mechanism that gives rise to electric-field noise from surfaces is not well-understood and remains an active area of research. In this work, we detail experiments intended to measure ion motional heating rates with exchangeable surfaces positioned in close proximity to the ion, as a sensor to electric-field noise. We have prepared samples with various surface conditions, characterized in situ with scanned probe microscopy and electron spectroscopy, ranging in degrees of cleanliness and structural order. The heating-rate data, however, show no significant differences between the disparate surfaces that were probed. These results suggest that the driving mechanism for electric-field noise from surfaces is due to more than just thermal excitations alone.
Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on
Anomalous motional heating is a major obstacle to scalable quantum information processing with trapped ions. While the source of this heating is not yet understood, several previous studies suggest that surface contaminants may be largely responsible
For the past two and a half decades, anomalous heating of trapped ions from nearby electrode surfaces has continued to demonstrate unexpected results. Caused by electric-field noise, this heating of the ions motional modes remains an obstacle for sca
We present measurements of the motional heating rate of a trapped ion at different trap frequencies and temperatures between $sim$0.6 and 1.5 MHz and $sim$4 and 295 K. Additionally, we examine the possible effect of adsorbed surface contaminants with
Measuring and understanding electric field noise from bulk material and surfaces is important for many areas of physics. In this work, we introduce a method to detect in situ different sources of electric field noise using a single trapped ion as a s